Interface directly with test equipment, and define how to probe a particular device/wafer. Define a wafer size, die size characteristics and then quickly draw out and edit the wafer map. Product engineers can mark the home die, reference die, remove and add die so that it’s an accurate representation of the actual wafer map for the device.
Automate Yield Reports including yield by test program or device. Via a single key click monitor the yield trends. Real time alerts with pre-set control limits prompt users if yield drops below a certain level.
yieldWerx’s powerful Lot Genealogy & History tool provides instant traceability of devices from the fab lot, all the way to the finished product, enabling users to follow the behavior of outlier and marginal units. Quick importing & exporting of pertinent data from SAP, ERP, & MES systems. All device information is stored in the yieldWerx Database Server, along with the corresponding test data from wafer sort, final test and even fab parametric test data. yieldWerx’s Lot Genealogy Module has enabled hundreds of users to find and solve yield issues in a fraction of the time of their earlier processes.
yieldWerx supports Klarf, STDF, ATDF, WAT & PCM and other Custom Data Formats. The yieldWerx Database’s WAT & PCM loader has been enhanced to additionally support the following foundry data formats.
We support data from the most popular test and assembly houses.
yieldWerx, the most Powerful and Reliable tool allows the product, device and process engineers the ability to quickly study, diagnose and put in place corrective actions enabling fast and efficient product release as well as driving yield enhancements.
yieldWerx Solutions are successfully running in wafer fabs, design houses, fabless companies, large test houses as well as test equipment manufacturers across USA, Canada, Europe & Asia Pacific.