Semiconductor Data Analysis Software
Your Test & Yield Analysis Solution House

Parametric Trend

This report allows you to generate trend charts for either a single parameter or groups of parameters where the units of measurements are similar. Graphically allows you to visualize trends/relationships as well as other key statistics. The report can be run for a single data set or a series of lots/wafers. You can filter, as well as group, data with a wide range of options [Applicable to both Wafer Probe as well as Final Test Data