Stacked Histogram

This report allows you to generate Bin summaries for both Wafer probe data as well as Final Test Data based on Bins, Soft Bins, as well as User Defined Bin Groups. The report shows you the yield for the selected data as well as other statistics as a series of stacked histograms. You can run the report for a single data set or for a series of selected lots/wafers. [Applicable to both Wafer Probe as well as Final Test Data]