Semiconductor Test Floor Efficiency Solutions

Test Floor Operations

With a floor of test equipment and a mix of products to assign to various test cells the managers and operators on a test floor can have a highly heterogenous environment to manage.  In a high mix-low volume facility they have the additional challenge that a test cell will be reconfigured three to four times a day.  Making test plans for the day, week, month, and quarter requires information on not simply the product you need to test.  Average test times, yield, and OEE provide planners essential data to know how best to balance the equipment available on the floor with each product’s committed dates and volume. Data which informs them of active usage of a tester and handler provides Overall Equipment Efficiency metrics.

 With such a mix of product and equipment a 60% efficiency is a common OEE value.  Dips below that number impact profitability adversely, having that number increase by a single percentage point has value.  Comprehending if your factory floor has a problematic tester by comparing relevant metrics with all your equipment will boost your factory floor’s overall equipment efficiency by taking that tester off-line.

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