Key Features of yieldWerx

• Support Wide Range of Data Formats
• Merge Lot Data Facility
• Manage and Analyze Data from Distributed Locations
• Interactive Charts
• Deep & Quick Analysis
• Export & Print Chart/Tabular Data
• Integrity and Accuracy
• Scalable & Extensible
• Responsive User Interface

Support Wide Range of Data Formats

Including STDF, ATDF, WAT & PCM, CSV and other custom data formats

Merge Lot Data Facility

Ability to merge lots tested during different time period or shifts and show the split lots data as master lot. Advanced logic to merge multiple wafer sort data as well as multiple temperature/final test screen data

Manage and Analyze Data from Distributed Locations

Gather and analyze data from facilities around the world into single tool/location

Interactive Charts

Charts drill down, zoom, tooltips and a variety of other options to configure the charts

Deep & Quick Analysis

Fast & quick access to data at the individual die & parameter level and the ability to summarize across multiple devices, lots & wafers

Export & Print Chart/Tabular Data

Export reports data into Excel, HTML formats…

Integrity and Accuracy

Highest level of accuracy and data integrity. No data is lost/screened or filtered out. The choice is left up to the end user

Scalable & Extensible

Scalable to meet fabless & design house needs as well as full scale semiconductor fabs and text houses

Responsive User Interface

Fast and efficient access, speedy reporting analysis with visual indicators allowing the user to see progress of analysis, ability to cancel operations at any level, fully multi-threaded user interface