Part Average Testing (PAT) is a statistical screening technique designed by the Automotive Electronics Committee (AEC) to improve the reliability of automotive electronics. The AEC provides guidelines for using statistical techniques to detect and remove abnormal lots of ICs to ensure reliable, high-quality electrical components for use in the harsh automotive environment.
Adherence to PAT guidelines is often contractually required of semiconductor suppliers by automotive, medical and other high-reliability application OEMs. Managing a contractual obligation for PAT is challenging, especially in cases of high production volumes. yieldWerx Enterprise provides the statistical analysis framework and workflows to simplify and ensure compliance of PAT requirements.