yieldWerx offers product and test engineers a collection of reliable, easily manageable, and robust tools that help improve productivity, improve yield, and reduce defects in the assembly line. yieldWerx converts semiconductor test data files into comprehensive reports, which provides graphical and statistical representation of data and reduces defect analysis cycle time for test engineers.

Our aim is to lower the cost and time for analysis of semiconductor test data through provision of concurrent, effective, and efficient solutions. yieldWerx Semiconductor is one of the pioneers in test data acquisition, analysis and reporting for semiconductor companies, design houses, and engineering groups. The solutions offered by yieldWerx Semiconductor have demonstrated success at lowering the overall cost of semiconductor testing, progressive improvement in quality, and bringing excellence in semiconductor test operations.

Foundry Data Formats Supported

yieldWerx supports Klarf, STDF, ATDF, WAT & PCM and other Custom Data Formats. The yieldWerx Database’s WAT & PCM loader has been enhanced to additionally support the following foundry data formats.