yieldWerx Enterprise excels at building standard production yield reports by vendor, device, lot, operation, etc. and managing access to these reports. Extending your team to include suppliers to review the appropriate Fab, Probe or Final Test report can improve your agility in responding to yield issues, and ensure that all stakeholders have access to the same data.
Commonality Analysis refers to a set of techniques used to identify systematic causes of yield loss. Because of the complexity and number of process steps involved in semiconductor manufacturing, pinpointing the cause of a yield issue can be a challenging task. yieldWerx Enterprise enables product engineers to systematically evaluate common variables within manufacturing processes to efficiently identify the source of yield issues.
Gauge R&R studies are critical to identifying unknown issues in measurement quality, and ANOVA is the preferred method for analyzing Gauge R& R results. ANOVA calculations are both highly detailed and time-consuming, creating a need for tools to automate the complex calculation process. yieldWerx Enterprise provides ANOVA tools for stakeholders concerned with measurement quality throughout the enterprise, including product, test and manufacturing engineers.
Because product costs are added with every step in the semiconductor supply chain, eliminating low-yielding material early in the manufacturing process optimizes overall costs. yieldWerx Enterprise can correlate Final Test yields to Wafer Probe yields to eliminate bad material at probe, leading to package, assembly and test cost savings.
Reducing valuable test time and optimizing utilization of test equipment can lead to lowered cost of goods (COGS) for semiconductor device manufacturers. yieldWerx Enterprise provides the sophisticated tools to analyze, correlate and monitor bin yields to remove redundant or unnecessary tests. These tools can provide significant cost savings, while maintaining confidence in outgoing product quality.