YIELDWERX EXHIBITS AT INTERNATIONAL TEST CONFERENCE (ITC) 2016
Posted By: yieldWerx on December 7, 2016
yieldWerx successfully exhibited at the International Test Conference (ITC) 2016 at Fort Worth Convention Center, Dallas, Texas from Nov 15-17, 2016. The conference was attended by more than 1000 people from semiconductor industry, academia and media. Around 50 exhibitors showcased their products in booths of various sizes at the ITC over the span of the three days.
YIELDWERX AT BOOTH # 514
Omar Malik (CEO), Aftkhar Aslam (CTO) and Paul Dennies (Head of Global Sales and Marketing) represented yieldWerx at booth # 514 at ITC 2016.
At ITC 2016, yieldWerx showcased the recently developed powerful monitoring and alerting modules such as SPC and the Management Dashboard, and test floor operations modules such as PAT, DPAT, and GDBN that have benefited several yieldWerx customers tremendously in overcoming yield management challenges. The booth attracted an audience from various sectors of the semiconductor industry like IP Providers, Test Equipment Manufacturers, IDMs, OSATs, Fabless design houses and Fabs. The visitors were given a demo of the core tool and add-on modules, highlighting the capabilities and the value proposition being offered by yieldWerx.
YIELDWERX AT ITC 2016 CORPORATE FORUM
Aftkhar Aslam, CTO yieldWerx presented “High Level Functionality of PAT and DPAT” at the ITC Corporate Forum. The Corporate Forum track was held in a meeting area adjacent to the exhibits floor where ITC exhibit attendees dropped in to see different forum presentations. The forum provided an opportunity to present the latest developments by yieldWerx and to promote their product at ITC.
For more details on yieldWerx modules and offerings, write to us at firstname.lastname@example.org