yieldWerx Exhibits at International Test Conference (ITC) 2015
Posted By: yieldWerx on October 27, 2015
yieldWerx exhibited at its first ever trade show, International Test Conference (ITC) 2015 (www.itctestweek.org) at Disney Hotel, Anaheim, California. The conference was held from Oct 6-8,2015 and more than 1000 people from industry, academia and media attended it. Over 50 exhibitors displayed their products in booths of various sizes at the ITC over the span of three days.
yieldWerx at Booth # 422
Aftkhar Aslam (CTO), Jeff Teza (VP Sales and Business Development) and Jami Wong (VP Marketing) represented yieldWerx at booth # 422. The booth attracted an audience from various sectors of the semiconductor industry like IP Providers, Test Equipment Manufacturers, IDMs, OSATs, Fabless design houses and Fabs. The visitors were given a demo of the yieldWerx tool, highlighting the capabilities and the value proposition it offers.
yieldWerx at ITC 2015 Corporate Forum
Aftkhar Aslam, CTO yieldWerx presented “The Importance of combining Lot Genealogy with Yield Data for End-to-End Yield Management” at the ITC Corporate Forum. The representatives of the company presented at the Corporate Forum track in a meeting area adjacent to the exhibits floor where ITC exhibit attendees dropped in to see different forum presentations. The forum provided an opportunity to present the latest developments by yieldWerx and to promote our activities at ITC. The abstract of the presentation by yieldWerx at Corporate Forum track is outlined below
“Lot Genealogy in MES systems form the backbone of operational logistics. Combining this data with ATE yield data is critical to resolving problems. The session explored how different levels of Lot Genealogy data can be used to solve problems using Yield Management Systems. The session used actual customer examples to highlight the benefits.”