Industries

Safety and Reliability with Uncompromised Yields

yieldWerx is your solution partner for unparalleled quality control and compliance,
consistently pushing higher yields with full lifecycle transparency.

Navigating the Complexities of the Automotive Industry

With the rise of autonomous driving, safety-critical systems like airbags and anti-lock brakes, reliability has become the number one challenge facing the automotive industry. Minor yield losses can lead to recalls, regulatory scrutiny, and a compromised brand image. The industry also faces stringent safety and compliance regulations that require performance verifications at every stage of production, making it essential to maintain high yields and ensure that defective components do not slip through the testing process.

Key Challenges

Zero Tolerance for Defects

Achieving safety and reliability with zero defects while maintaining high yield

Rigorous Compliance Regulations

Meeting stringent compliance and safety regulations at every stage of production defect-free

Supply Chain Variability

A diverse and complex supply chain where location and material variability greatly impact quality

How It Works

How yieldWerx Supports  
the Automotive Industry

Real Time Process Control

Ability to calculate dynamic PAT limits real time and interact with tester and test programs to modify limits by lot, wafer, screen, and site.

PAT++

Ability to execute post data collection PAT analysis for both wafer sort and final test data.

PAT Rules by Touchdown Counts

Removes unknown good die where max number of touchdowns have been exceeded.

AMG Enhancements

Custom pick lists and maps using bin or parametric data while supporting multi die, sub die, and reticles, complete traceability with time-sequenced data

Multidimensional Wafer Merge

Automates wafer merges across diverse data sets and apply policies and characteristics allowing for what-if analysis and assembly map generations.

Process/Yield Analytics & Reporting

Provides holistic end-to-end data visualizations across manufacturing lifecycle for high volumes of data.

AI-Powered Commonality Analysis

Automate cross center anomaly detection utilizing the power of AI to identify causes of yield loss originating from difference equipment or processes.

Unified Data Repository.

Harmonized data across the product lifecycle for cross-stage analysis

Quality Control & Risk Containment

Robust outlier control with customizable limits, non-gaussian data distribution, and predictive detection allows for early defect detection.

Sharpen Your Competitive Edge

Discover the yieldWerx difference and revolutionize your semiconductor operations. Schedule a demo today!