Our four foundational components, which sit at the heart of our architecture, facilitate the secure integration of data across the entire semiconductor lifecycle, cleaning and augmenting data with critical information, removing bad data, and utilizing automation to ensure easy accessibility.
A robust architecture that supports complex data retention rules.
Facilitates bi-directional data integrations across industry tools and manufacturing engineering systems.
Single source-of-truth database harmonizing data across semiconductor lifecycle. yieldWerx still enables users and companies to create as many databases as they need – practical uses of this feature include the ability to have Engineering, Production, Characterization databases etc.
Automated data acquisition with cleaning and data augmentation.
Harmonizes data across semiconductor lifecycle
Such as with SAS, JMP, Excel, BI Tools, Python and other tools
Allows for deep AI/ML dispositioning
Cloud-based, on-premise or hybrid options for secure seamless access
Applies rules for cleaning, parsing, and enriching data
Distinguishes between good and bad data generating real-time health dashboards and alerts
Especially applicable for Final Test and Wafer Sort Yield rules
Performs advanced pattern recognition linking images to wafer maps or other data sources
Analyzes visual data correlating to any data source
Supports complex data retention policies that meet contractual and industry compliance
Improves system performance
Supports replication of data into other reporting and data warehouses
Supports 3rd party integrations across industry tools and manufacturing engineering systems
Such as SAP, QMS, AMS, and other MES applications leveraging API's and other SDK's
Pushes and Pulls data real-time synchronously or asynchronously
Ability to place holds based on information provided by 3rd party tools
Discover the yieldWerx difference and revolutionize your semiconductor operations. Schedule a demo today!
