yieldWerx serves as the enterprise platform for high-quality photonics manufacturing data, spanning wafer probe, optical wafer acceptance test (OWAT), electrical wafer acceptance test (EWAT), module and device assembly, burn-in, and final system test. The platform manages raw data and produces enriched, post-processed results including PAT, virtual binning using custom optical/electrical limits, GDBN/GDBN-Z, multisite merging, multi-insertion merging, and automated pick-map generation. These analytics-ready outputs become the foundation for Design of Experiments (DoEs), parametric optimization, and custom analytics pipelines in photonics manufacturing and optical I/O.
As AI infrastructure, optical networking, and heterogeneous integration continue scaling, photonics manufacturers face increasingly complex manufacturing and test challenges spanning optical, electrical, thermal, and packaging interactions across device production flows. The yieldWerx platform provides a unified environment for photonics data analytics — analyzing optical test data, electrical measurements, wafer defect inspection, spectral behavior, reliability trends, and manufacturing process data across the complete production lifecycle.
Multiple test domains, formats, and vendors create fragmentation that prevents rapid, confident decision making.
Siloed systems obscure traceability from wafer probe through assembly and final verification, slowing yield learning and root-cause analysis.
Manual scripts and one-off analyses cannot keep pace with high-volume photonics manufacturing and evolving device architectures.
Our collaboration with yieldWerx gave us measurable results in just 30 days. Their platform ingested our complex photonics data, and the insights have accelerated how we make yield and quality decisions.
— Garth Thompson, CIO, Ayar Lab
yieldWerx is more than a real-time monitoring tool. It is a photonics manufacturing analytics platform built with photonics engineers to manage the complexity of silicon photonics, optical I/O, PIC manufacturing, and optoelectronic semiconductor production at every stage of the product journey — from initial concepts and hand-tested prototypes, through engineering and pilot runs, low-volume builds, and full high-volume production.
yieldWerx scales with you. The same platform that captures and analyzes data from your first benchtop measurements grows into a complete photonics data analytics, yield management, and optical-to-electrical correlation system across wafer, assembly, and final test — preparing manufacturers for the next generation of AI-driven and co-packaged optical systems.
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Ayar Labs, a leading U.S. photonics company selected yieldWerx for its ability to rapidly deploy a true end-to-end solution. In just 30 days, yieldWerx ingested heterogeneous photonics data sources, implemented wafer-to-module-to-system traceability, enabled automated PAT/GDBN workflows, and delivered production-ready dashboards and DOE-ready datasets. The decision was driven by our configurable platform, speed-to-value execution model, and deep domain expertise in photonics and optical I/O manufacturing.
YieldWerx offers free webinars and downloadable resources covering functionality, data formats and standards, lessons learned, and best practices to elevate your photonics solutions. Sign up below to access these materials and build the foundation to scale your innovation.