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Automated Analysis & Dispositioning

Automated Analysis & Disposition

Automated Analysis & Disposition - header

Automated Data Acquisition, Cleaning,
and Augmentation

This foundational module provides lights-out, 24X7 data acquisition into our unified data repository with the ability to apply complex business rules to clean, parse, and enrich data in the process. The system can automatically distinguish between good and bad data and generate real-time health dashboards and alerts to ensure proactive monitoring of load failures and warnings.

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Sub-Modules

Dynamic Yield Calculation

Yield calculations rules engine catered for products in Final Test (First Pass, Rescreen, QCPasses) as well as for Wafer Sort. Yield rules include GDPW, probed die to not be included in yield calculations, and others. Guarantees 100% accurate yield calculations.

Memory & Bitmap Analysis 

Memory, Bit Map, Optical Sensor, Pixel Map analysis with the ability to perform rudimentary as well as advanced pattern recognition. Also includes ability to link images/analysis to Wafer Maps (Bin/Parametric) and any other data source collected and managed within yieldWerx that is powered by the Lot Genealogy module. 

Inspect Image Management 

Ability to manage and analyze any type of Image Data (Inspection, Metrology, Defect Images etc.) that can be standalone or connected to any other data source for correlation and traceability.

System Health Monitoring

Real time and customizable alerts and email notifications on raw data load failures with the ability to automatically or manually apply corrective actions. Dashboards and Metrics generated on Raw Data Loads allowing for yieldWerx customers to generate KPI's/SLA's with vendors and suppliers. 

How Can This Module Benefit You?

Lights out 24X7 Automated Data Ingestion Push/Pull 

Applies rules for cleaning, parsing, and enriches data of different types and sources 

Lot Genealogy 

Automated transformation of data to build lot genealogy and establish real-time relationships of data (internal/external) and associate to product lifecycle (Chip Design, Manufacturing, Assembly/Test, System/Board Level, and beyond) 

Monitors and Real-Time Alerts

Distinguishes between good and bad data sets, engineering vs production data, and generates real-time health dashboards and alerts

Dynamic Yield Calculations 

Especially applicable for Final Test and Wafer Sort Yield rules

Memory and Bitmap Analysis

Performs advanced pattern recognition linking images to wafer maps or other data sources

Inspect Image Management 

Analyzes visual data correlating to any data source
Figma Content Section
Dynamic Yield Calculation
Dynamic Yield Calculation
Yield calculations rules engine catered for products in Final Test (First Pass, Rescreen, QC Passes) as well as for Wafer Sort. Yield rules include GDPW, probed die to not be included in yield calculations, and others. Guarantees 100% accurate yield calculations.
Schedule a Demo
Value Added Benefits
  • Flexible yield calculation rules
  • Especially beneficial to products in Final Test
  • Guarantees 100% accurate yield calculations
Figma Content Section
Memory and Bitmap Analysis
Memory and Bitmap Analysis
Memory, Bit Map, Optical Sensor, Pixel Map analysis with the ability to perform rudimentary as well as advanced pattern recognition. Also includes ability to link images and analysis to Wafer Maps (Bin/Parametric) and any other data source collected and managed within yieldWerx that is powered by the Lot Genealogy module.
Schedule a Demo
Value-Added Benefits
  • Advanced geo-spacial pattern recognition on memory, bitmaps, and others
  • Ability to link images and analytics to wafer bin and parametric
  • Can link any other file types to wafer maps
Figma Content Section
Inspect Image Map
Inspect Image Map
Ability to manage and analyze any type of Image Data (Inspection, Metrology, Defect Images etc.) that can be standalone or connected to any other data source for correlation and traceability.
Schedule a Demo
Value-Added Benefits
  • Any type of image data including inspection, metrology, and defect can be linked to source
  • Images can be standalone or connected for full traceability
Figma Content Section
System Health Monitoring
System Health Monitoring
Real time and customizable alerts and email notifications on raw data load failures with the ability to automatically or manually apply corrective actions. Dashboards and Metrics generated on Raw Data Loads enable yieldWerx customers to generate KPIs and SLAs with vendors and suppliers.
Schedule a Demo
Value-Added Benefits
  • Real time alerts and notifications on load failures
  • Auto or manual application of corrective actions
  • Raw data load metrics enable efficient creation of KPI and SLA's
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PTC-Logo

PTC

Partner

Envelope
PTC is a semiconductor consulting firm based in Malaysia, providing strategic and technical consulting services to semiconductor manufacturing, assembly, test, product and ecosystem companies across Asia. yieldWerx, a leading innovator in semiconductor yield management solutions, and PTC, a premier Malaysia-based consulting firm for the semiconductor manufacturing industry, have announced a strategic collaboration to address the growing need for comprehensive data analytics across the semiconductor manufacturing lifecycle in the rapidly expanding markets of Malaysia and India.
This collaboration combines yieldWerx’s state-of-the-art analytics platform with PTC’s extensive industry knowledge and regional presence to strengthen semiconductor manufacturing capabilities across East Asia. By providing sophisticated analytics solutions tailored to regional needs, yieldWerx and PTC aim to streamline factory setup and operations, implement rigorous quality assurance protocols, and accelerate the development of sustainable semiconductor ecosystems across both countries. PTC will act as the regional consulting partner, offering advisory, deployment support, and strategic integration services to fabless clients, OSAT facilities, and manufacturing startups adopting the platform.