AI-Powered PAT: A New Era of Smarter Manufacturing
For the past three decades, the Automotive Electronics Council (AEC) has utilized Part Average Testing (PAT) as the standard for statistical screening. However, technological advancements beyond Moore’s Law have outpaced…
KLARF File Format: Enhancing Semiconductor Yield Analysis with yieldWerx
Understanding the KLARF File Format In the semiconductor industry, a KLARF file (KLA-Tencor Advanced Results File) is a specialised file format used to store data collected from semiconductor wafer inspection…
The 2022 CHIPS Act May Be Repealed: What Does This Mean for You?
The CHIPS and Science Act 2022 was passed with bipartisan support under the Biden administration to strengthen semiconductor manufacturing in the United States and reduce reliance on foreign supply chains…
End-to-end Semiconductor Data Analytics and Traceability Solutions For Multi-Chip Packages
Efficient test data integration is crucial for producing reliable multi-chip packages (MCPs. However, fabless companies, IDMs and OSATs face significant challenges in handling diverse test data formats associated with individual…
Semiconductor Traceability Using Lot Genealogy For Multi-Chip Modules
Multi-chip modules involve intricate workflows where devices traverse multiple stages, interact with other components, and integrate into sophisticated packages. However, this complexity brings significant challenges when it comes to lot…
How to Deal with the Challenges of MEMS Test Data Management and Yield Analysis
MEMS (MicroElectroMechanical Systems) are marvels of modern engineering. They blend mechanical and electrical components to enable advanced technologies like LiDAR, medical imaging, accelerometers, microphones, and pressure sensors. While their design…
Golden Eye: Enhancing Semiconductor Yield with Automated Optical Inspection Data
Automated optical inspection (AOI) is a powerful quality improvement tool for screening out dies with any visual defect. It uses high-speed cameras, special lights, and smart software to analyze pictures…
Ultimate Guide to Outlier Detection Using Part Average Testing
What is Part Average Testing PAT? Hidden reliability issues in ICs often remain undetected during production, only to appear once the chip is in use, potentially leading to costly system…
Understanding the Significance of STDF Data in Semiconductor Testing
Accurate and efficient test data management is crucial in the semiconductor industry for maintaining high yields and ensuring product quality. Among the various formats used to store test data, the…
Overcoming Semiconductor Yield Management Challenges Using AI and ML
The semiconductor industry has come a long way from the days of simply sorting “good units” from “bad units.” Today, yield analysis dives deep into data science, uncovering many factors…