Harmonized End-to-End Data Analytics Across Your Entire Supply Chain

Unlike Fabless customers, which focus on designing products, and foundries, which focus on the production line, IDMs are large-scale semiconductor companies that have the means to do everything from designing to producing products.

Features

Smart Manufacturing From Design to
Fabrication for Big Data Analytics

Make sense of the billions of data points collected across your entire design flow and maintain a pulse on your product’s yield in real-time. Discover how our powerful product suite can streamline your production process, alleviate engineering inefficiencies and drive quality at scale, helping you stay ahead of the competitive market.

End-to-End Supply Chain Visibility

Our Unified Data Repository serves as the single source
of truth, consolidating data as and when necessary throughout the design, manufacturing, assembly, and test processes. This includes the ability to handle Process, Defect, Metrology/Critical Dimension data, images, and much more, extending to System Level Test, Board Assembly, and End Application data. This data can then be analyzed by Production Planners, Process Engineers, and others to determine the location of material, yield losses, planning for new lot starts, production capacity needs, and more.

Single source of truth encompassing data across the entire supply chain and product lifecycle

Unified Data Repository serving as the definite source of truth that is robust and scalable

3^rd Party Integration allows bi-directional integration with MES, SAP, QMS, AMS and other applications

Real-Time Monitoring and Reporting

IDMs can access real-time process and yield test data, as well as health monitoring for uick feedback loops and timely interventions. This includes the ability to monitor lots and equipment on Engineering or Manufacturing Holds. yieldWerx provides the ability to interact with Process and Test/Assembly equipment—allowing for passive monitoring, intervention, or full control of the equipment. Additionally, it integrates with enterprise-wide systems like MES (Manufacturing Execution Systems), QMS (Quality Management Systems), and AMS (Asset Management Systems), offering deeply integrated solutions and functionality.

Process/Yield Analytics & Reporting - Over 300 ready-to-use reports, powerful BI

Automated Alerts and 24/7 health monitor

Securely accessible from any smart device anywhere around the world

Scalability and Flexibility

yieldWerx can manage large volumes of production data through our scalable infrastructure. Our data storage and modules are designed to handle gigabytes/terabytes of data on a daily basis, with large-scale databases in the order of petabytes. yieldWerx also supports multiple databases to handle Engineering, Characterization, and Production data. Additionally, yieldWerx offers Data Warehousing solutions that ingest data from various sources, providing a one-stop shop for data and yield analysis across a much richer data set.

Manage large volumes (up to petabytes) of data securely through a scalable infrastructure

Architecture that supports multiple databases to handle Engineering, Characterization, and Production data

Data warehousing solutions that can ingest data from multiple sources

Rapid Root Cause Identification

With yieldWerx’s AI/ML-assisted defect detection and rapid drill-down root cause knowledge graphs, IDMs can easily sift through billions of data points to pinpoint root causes quickly and accurately. This enables faster decision-making to interdict manufacturing processes and equipment. yieldWerx also supports Feed Forward and Feedback Closed Loops, which can then modify manufacturing recipes, probing patterns, test programs, or test limits, to name a few.

Root Cause Knowledge Graphs enable rapid AI-assisted defect analysis

Defect Management uses image guided correlation analysis to find defects quickly and accurately

Supports Feed Forward and Feedback Closed Loops

Cost Reduction

Our solution helps minimize yield loss through clear yield rate analytics, reducing scrap, rework, and retests to reduce test time and other causes of yield loss.

Custom Limits Manager for accurate what-if analysis allowing for flexible rebins without retests

Yield Prediction enhances forecasting accuracy for escape prevention

Wafer Bank Scrapping allows for die level selection for scrap and downgrade