Industries

Yield Analytics for Photonics and Optoelectronic Semiconductor Devices

yieldWerx serves as the enterprise platform for high-quality photonics manufacturing data, spanning wafer probe, optical wafer acceptance test (OWAT), electrical wafer acceptance test (EWAT), module and device assembly, burn-in, and final system test. The platform manages raw data and produces enriched, post-processed results including PAT, virtual binning using custom optical/electrical limits, GDBN/GDBN-Z, multisite merging, multi-insertion merging, and automated pick-map generation. These analytics-ready outputs become the foundation for Design of Experiments (DoEs), parametric optimization, and custom analytics pipelines in photonics manufacturing and optical I/O.

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Navigating the Complexities of the Photonics Industry:

As AI infrastructure, optical networking, and heterogeneous integration continue scaling, photonics manufacturers face increasingly complex manufacturing and test challenges spanning optical, electrical, thermal, and packaging interactions across device production flows. The yieldWerx platform provides a unified environment for photonics data analytics — analyzing optical test data, electrical measurements, wafer defect inspection, spectral behavior, reliability trends, and manufacturing process data across the complete production lifecycle.

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Key Challenges

Bridging Fragmented Data into Usable Insight

Multiple test domains, formats, and vendors create fragmentation that prevents rapid, confident decision making.

Achieving True End-to-End Visibility

Siloed systems obscure traceability from wafer probe through assembly and final verification, slowing yield learning and root-cause analysis.

Replacing Manual Analytics with Scalable Workflows

Manual scripts and one-off analyses cannot keep pace with high-volume photonics manufacturing and evolving device architectures.

Our collaboration with yieldWerx gave us measurable results in just 30 days. Their platform ingested our complex photonics data, and the insights have accelerated how we make yield and quality decisions.

How It Works

How yieldWerx Supports
the Photonics Industry:

Comprehensive Quantitative Analysis

Evaluate spectral performance, insertion loss, BER, power, wavelength stability, and color/brightness where applicable across photonic and optoelectronic devices; supports PAT, PCA, DOE-ready datasets, and advanced statistical workflows for photonics data analytics.

Robust Statistical Process Control

Monitor optical and electrical results across lots and insertions using photonics SPC methods for early yield deviation detection; supports GDBN/GDBN-Z modeling for anomaly detection, process stability tracking, and photonic manufacturing control.

Optical and Electrical Test Defect & Image Correlation

Overlay inspection images and defect maps with OWAT/EWAT outcomes and die locations; supports automated pick-map generation.

Unified Photonics Data Repository

Harmonize wafer probe, OWAT/EWAT, assembly, burn-in, final test, and field-return data into a unified photonics manufacturing analytics platform; enables pixel-, die-, site-, and module-level correlation across optical, electrical, and reliability datasets for end-to-end yield analytics and traceability.

Process & Yield Analytics

Apply DOE, PCA, ANOVA, T-Tests, correlation analysis,  commonality analysis, and parametric modeling across photonic and optoelectronic manufacturing data to accelerate yield ramp, improve process understanding, and optimize device performance.

Silicon Photonics and PIC Manufacturing Analytics

Supports silicon photonics, photonic integrated circuits (PICs), optical I/O, co-packaged optics (CPO), and heterogeneous integration manufacturing environments requiring advanced photonics yield analytics and production monitoring.

Automated Analysis & Dispositioning

Merge wafers/modules using configurable rules and policies to reduce variability and engineer touch time in photonics manufacturing workflows; supports automated yield management and rule-based photonic device dispositioning across wafer, optical test, and final test data.

Quality Control & Risk Containment

Advanced outlier control, PAT++, and predictive risk scoring with virtual binning using optical and electrical limits for early yield risk detection in photonic and optoelectronic manufacturing environments.

AI-Powered Commonality & Root-Cause
Analysis

AI/ML knowledge graphs identify recurring failure signatures across process tools, lots, designs, and optical/electrical datasets to enable advanced photonics root-cause analysis and yield limiter identification.

Automated Lot Disposition

Compare cross-lot performance and environmental factors to recommend data-driven disposition policies for photonics yield management, wafer test analysis, and optical/electrical performance optimization.

End-to-End Lifecycle Traceability

Wafer → die → coupon → module → final system mapping with full genealogy reporting and audit readiness for silicon photonics, PIC manufacturing, and optoelectronic device traceability.
Built for Photonics Engineers. Proven from First Prototype to Full Production.

yieldWerx is more than a real-time monitoring tool. It is a photonics manufacturing analytics platform built with photonics engineers to manage the complexity of silicon photonics, optical I/O, PIC manufacturing, and optoelectronic semiconductor production at every stage of the product journey — from initial concepts and hand-tested prototypes, through engineering and pilot runs, low-volume builds, and full high-volume production.

yieldWerx scales with you. The same platform that captures and analyzes data from your first benchtop measurements grows into a complete photonics data analytics, yield management, and optical-to-electrical correlation system across wafer, assembly, and final test — preparing manufacturers for the next generation of AI-driven and co-packaged optical systems.

Contact us to learn more.

Customer Story: The 30-Day Challenge

Ayar Labs, a leading U.S. photonics company selected yieldWerx for its ability to rapidly deploy a true end-to-end solution. In just 30 days, yieldWerx ingested heterogeneous photonics data sources, implemented wafer-to-module-to-system traceability, enabled automated PAT/GDBN workflows, and delivered production-ready dashboards and DOE-ready datasets. The decision was driven by our configurable platform, speed-to-value execution model, and deep domain expertise in photonics and optical I/O manufacturing.

Want to learn more?

YieldWerx offers free webinars and downloadable resources covering functionality, data formats and standards, lessons learned, and best practices to elevate your photonics solutions. Sign up below to access these materials and build the foundation to scale your innovation.

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wats

WATS

Partner

WATS is a test data management and analytics platform developed by Virinco, built to collect, standardize, and analyze data from electronics manufacturing test systems. It provides real-time visibility into board-level performance across ICT, functional test, and final test operations, helping engineers monitor yield, detect anomalies, and improve quality at high volume.

EnlightTec

Partner

Enlight Technology is one of the few domestic electronic design automation (EDA) solution providers. Our primary mission is to develop chip and electronic hardware, as well as system development tools, striving to help customers bring their products from concept to market with the best efficiency and effectiveness.
We integrate EDA technology resources and solutions, leveraging practical experience and technical support capabilities to build a complete cross-disciplinary ecosystem covering silicon photonics, chips, advanced packaging, systems, and manufacturing. Enlight Technology is one of the very few Taiwanese EDA solution providers with both electrical and optical design capabilities. It offers one-stop support, from silicon photonics (PIC) optoelectronic integration circuit design and EIC–PIC co-design, to end-to-end design verification of ICs, packages, and PCB systems:

  • Silicon Photonics & EIC–PIC Co-design
  • IC Design & Verification
  • PCB Systems Design & DFM (Design for Manufacturability)
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Modus Test

Partner

Modus Test, LLC was founded on the idea that there are creative ways to improve results by combining innovation with the best known methods in test design and manufacturing. Providing innovative test solutions include the MPT series of parametric test and systems and accessories.
Modus Test has a global presence and the capability to support customers in all the IC development centers and high volume manufacturing sites around the world. See for yourself how combining innovation with best-known methods can improve your results.
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PTC

Partner

PTC is a semiconductor consulting firm based in Malaysia, providing strategic and technical consulting services to semiconductor manufacturing, assembly, test, product and ecosystem companies across Asia. yieldWerx, a leading innovator in semiconductor yield management solutions, and PTC, a premier Malaysia-based consulting firm for the semiconductor manufacturing industry, have announced a strategic collaboration to address the growing need for comprehensive data analytics across the semiconductor manufacturing lifecycle in the rapidly expanding markets of Malaysia and India.
This collaboration combines yieldWerx’s state-of-the-art analytics platform with PTC’s extensive industry knowledge and regional presence to strengthen semiconductor manufacturing capabilities across East Asia. By providing sophisticated analytics solutions tailored to regional needs, yieldWerx and PTC aim to streamline factory setup and operations, implement rigorous quality assurance protocols, and accelerate the development of sustainable semiconductor ecosystems across both countries. PTC will act as the regional consulting partner, offering advisory, deployment support, and strategic integration services to fabless clients, OSAT facilities, and manufacturing startups adopting the platform.