Optimize Yield for ASIC, MSP, and Analog Systems

The designs of ASIC, MSP, and Analog devices are inherently complex, due to their high sensitivity to manufacturing variations and custom logic. These industries require precise process control, as even small deviations can significantly impact device performance. Analog devices, in particular, are highly susceptible to process variability such as voltage flunctuations, resistor tolerance, and capacitor variance. Aging and environmental factors can also lead to yield loss and degraded performance. Testing is more complex, as it involves continuous variables and demands high precision validation techniques. The need for customizations for integrating both analog and digital components in mixed-signal systems also adds layers of complexity to yield optimization.