Industries

Boost MEMS Yield and Ensure Consistent Quality with yieldWerx

yieldWerx can help MEMS companies handle the challenges and complexity of MEMS
devices, microfabrication, and high-volume manufacturing.

Navigating the Complexities of the MEMS Industry

The complexities of microfabrication and multi-stage production accompanied by high volume production are challenges for yield loss in the MEMS industry. MEMS devices undergo highly specialized multi-step processes including photolithography, etching, deposition, and bonding, all which involve mechanical and electrical compoennts at the the micron and sub-micron level. Comparing data across these stages and complex variables across the entire manufacturing lifecycle are critical to product integrity.

Key Challenges

Micro-Scale Precision

Magnified Yield Loss at Micro and Sub-Micro levels

High Sensitivity to Defects

sub-micron defects are difficult to detect by traditional methods and require advanced defect correlation

Manufacturing Variability

Multitude of facilities and locations that produce MEMS each with varying calibration, tolerances, and properties adds significant challenge to consistent quality

How It Works

How yieldWerx Supports
the MEMS Industry

Unified Data Repository

Harmonized data across the product lifecycle for cross-stage analysis.

Process/Yield Analytics & Reporting

Provides holistic end-to-end data visualizations across manufacturing lifecycle for high volumes of data.

Automated Analysis & Dispositioning

Automate wafer merge across diver sets of data and apply unique rules and polices to merged data.

Quality Control & Risk Containment

Robust outlier control with customizable limits and predictive detection allows for early defect detection.

Defect Management

Correlates image-guided data from metrology tools and test data to quickly and accurately identify defects and their root causes at the micron scale.

AI Powered Commonality Analysis

Automate cross center anomoly detection utilizing the power of AI to identify causes of yield loss originating from difference equipment or processes.

Root Cause Knowledge Graphs

AI-driven knowledge graphs help identify root causes by visually guiding users through weighted paths to identfiy root causes quickly and accurately.

Micro-Electro-Mechanical systems

Micro-Electro-Mechanical systems require high precision and sensitive measures and are highly prone to defects.

Cross-Lot comparison

Our Cross-Lot comparison module helps identify inconsistencies related to material issues, reducing variability due to environmental factors.

Traceability

Maintain complete traceability throughout the product lifecycle to identify root causes and maintain audit compliance.

Scalability

Scalability allows parameters to be tracked across a wide variety of product types, ensuring that each MEMS device maintains high yields across different industry requirements.

Sharpen Your Competitive Edge

Discover the yieldWerx difference and revolutionize your semiconductor operations. Schedule a demo today!