Industries

Accelerating Large-Scale, Complex Photonics Data for Optical I/O Solutions

yieldWerx serves as the enterprise platform for high-quality photonics manufacturing data, spanning wafer probe, optical wafer acceptance test (OWAT), electrical wafer acceptance test (EWAT), module and device assembly, burn-in, and final system test. The platform manages raw data and produces enriched, post-processed results including PAT, virtual binning using custom optical/electrical limits, GDBN/GDBN-Z, multisite merging, multi-insertion merging, and automated pick-map generation. These analytics-ready outputs become the foundation for Design of Experiments (DoEs), parametric optimization, and custom analytics pipelines in photonics manufacturing and optical I/O.

Navigating the Complexities of the Photonics Industry:

As photonics moves from R&D to high-volume manufacturing, the challenge is no longer generating data — it is turning highly heterogeneous photonic, optical, and electrical test data into clean, contextualized information that teams can trust. yieldWerx enables this shift by providing a unified data model, automated enrichment, and analytics that operate across wafers, modules, systems, and field-return data. This is exactly where yieldWerx is helping leading photonics companies today.

Key Challenges

Bridging Fragmented Data into Usable Insight

Multiple test domains, formats, and vendors create fragmentation that prevents rapid, confident decision making.

Achieving True End-to-End Visibility

Siloed systems obscure traceability from wafer probe through assembly and final verification, slowing yield learning and root-cause analysis.

Replacing Manual Analytics with Scalable Workflows

Manual scripts and one-off analyses cannot keep pace with high-volume photonics manufacturing and evolving device architectures.

How It Works

How yieldWerx Supports
the Photonics Industry:

Comprehensive Quantitative Analysis

Evaluate spectral performance, insertion loss, BER, power, wavelength stability, color/brightness where applicable; supports PAT, PCA, and DOE-ready datasets.

Robust Statistical Process Control

Monitor optical and electrical results across lots and insertions; supports GDBN/GDBN-Z for early deviation detection.

Defect & Image Data Correlation

Overlay inspection images and defect maps with OWAT/EWAT outcomes and die locations; supports automated pick-map generation.

Unified Data Repository

Harmonize wafer probe, OWAT/EWAT, assembly, burn-in, final test, and field-return data; supports pixel-, die-, site-, and module-level correlation.

Process & Yield Analytics

DOE, PCA, ANOVA, T-Tests, correlation, commonality, and parametric analysis to accelerate yield ramp and device optimization.

Automated Analysis & Dispositioning

Merge wafers/modules using configurable rules and policies to reduce variability and engineer touch time.

Quality Control & Risk Containment

Advanced outlier control, PAT++, and predictive risk scoring with virtual binning using optical/electrical limits.

AI-Powered Commonality & Root-Cause
Analysis

AI/ML knowledge graphs identify recurring failure signatures across process tools, lots, or designs.

Auto Lot Disposition

Compare cross-lot performance and environmental factors to recommend data-driven disposition policies.

End-to-End Lifecycle Traceability

Wafer → die → coupon → module → final system mapping with genealogy reporting and audit readiness.

Sharpen Your Competitive Edge

Discover the yieldWerx difference and revolutionize your semiconductor operations. Schedule a demo today!