Discover how yieldWerx is your one-stop solution from New Product Introduction to 
Volume Ramp to Advanced Production.
															Robust Characterization and Gage R&R reports
Leverage AI to help with precision defect analytics down to design flaws
Cross-correlate defect and statics on custom datasets
Image-guided visualizations for data-driven actions
															24/7 process monitoring
Optimize wafer test efficiency, custom pick maps with custom policies without manual scripting
BI dashboards with real-time test data
Full statistical process control of SPC/SBL/SYL
															Full statistical process control of SPC/SBL/SYL across wafer and die
For clean and smart data management
Lot dispositioning automations and AI assistance
AI algorithms for cross correlation analysis across dataset
															





















Discover the yieldwWerx difference and revolutionize your semiconductor operations. Schedule a demo today!