Advanced Characterization Management for Fast Qualification
by
YieldWerx
In the Semiconductor Age, billions of products worldwide depend on the reliability of ICs. The competitiveness in the semiconductor industry is extremely hard. Therefore, as an example, manufacturers are constrained…
Blog
Recent Posts
- The Importance of Long-Term Data Archiving in The Semiconductor Test Industry
- Understanding the Significance of STDF Data in Semiconductor Testing
- Overcoming Semiconductor Yield Management Challenges Using AI and ML
- A Guide to Implementing Yield Management Software in the Semiconductor Industry
- Best Practices for Sensing Failures in Automotive ICs
Tags
ATDF
Automated Reports
Automated Testing System
big data analytics
Big Data Systems
Characterization
Chip Production
Contractual Data Archival
CSV
Design of Experiments (DOE)
Fabless Companies
Fabrication
Final Test
GDBN
Genealogy Analytics
Outliers
Parametric
Part Average Test (PAT)
Prob Testing
Process Capability Index (CPK)
Real-time Tracking of Yield Issues
Rectify Yield Issues
Root Causes of Yield Losses
Semiconductor Data Requirements
Semiconductor Manufacturing Process
Semiconductor Production
semiconductor testing
Semiconductor wafer manufacturing
Semiconductor Yield Managment
Semiconductor Yield Strategy
Six Sigma
SPC Analysis
SPC Monitoring
SPC semiconductor
wafer handling
wafer tools
Yield Engineering
yield enhancement
Yield Reporting
Yield Tracking Systems
yieldWerx Enterprise Modules
yieldWerx Enterprise Software
YMS
YMS Solution Components
Zero Defect Tools