Why It is a Good Idea to Outsource Your Yield Management System
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YieldWerx
Typically, a yield management solution is born out of necessity. A well-established technology node needs it to stay competitive and profitable whereas a new product needs it to quickly diagnose…
Blog
PAT, GDBN Outlier Detection Moving Beyond Automotive
by
YieldWerx
Semiconductor testing is a walk on the tightrope because of the latent defects that emerge in chips later in their life when they are part of an end-product. That’s why…
Big Data Revolution at Chip Industry’s Doorsteps
by
YieldWerx
Semiconductor Manufacturing is not a stranger to “Big Data”. Intel alone manages 59 Data Centers and over 130,000 servers for its internal design and manufacturing operations. In fact, the capital…
Recent Posts
- Ultimate Guide to Outlier Detection Using Part Average Testing
- Understanding the Significance of STDF Data in Semiconductor Testing
- Overcoming Semiconductor Yield Management Challenges Using AI and ML
- A Guide to Implementing Yield Management Software in the Semiconductor Industry
- Best Practices for Sensing Failures in Automotive ICs
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