Yield Management Software for Fabless Companies

Fabless Pat Dashboard

Real Time and Predictive Analytics for Fabless Companies

Optimizing every stage of the manufacturing process for Fabless companies by enabling data-driven decision-making.

Advanced Visualizations and Analytics

Streamlined Analytics and Reporting:

Monitor yield data and production metrics and create detailed reports to guide strategic decisions.

Advanced PAT and SPC:

Take advantage of our PAT module with static, dynamic, multivariant and non-Gaussian analysis options. Enhance production through real time parametric SPC control charts and alert system.

Automated Data Management:

Expediate data processing through automative workflows from over 100 different data sources. Streamline operations by merging PAT and SPC modules with MES systems directly.

Early Fault Detection:

Employ advanced statistical methods to predict and mitigate potential issues before they impact production and pinpoint areas for optimization and improvement.

Fabless 1
Fabless PAT 2

Boosting Production Efficiency: Enhancing Yield and Speed

Improved Yield Optimization:

Identifying yield limiters and optimizing processes to enhance overall yield and product quality.

Faster Root Cause Analysis:

Quickly pinpointing the root causes of yield issues and defects to minimize production downtimes and improve product reliability.

Improved Testing Efficiency:

Optimizing testing processes, eliminating redundancy, and managing variations between test sites leading to reduced test times and costs

Reach Production Faster:

Quickly transition from design and testing to full-scale production with efficient yield management and real-time monitoring. Identifying yield limiters and optimizing processes to enhance overall yield and product quality.

Scalable Solution

Modular:

Tailored solutions that evolve with sector needs and are easily scalable on either On-Prem, Cloud or Hybrid infrastructure.

Custom Development:

Get extensive modeling and real-time analytics specific to the company’s requirements through our experienced team.

Businessman,Touching,Glow,Cpu,And,Electronics,Circuit
Fabless Pat Dashboard

Real Time and Predictive Analytics for Fabless Companies

Optimizing every stage of the manufacturing process for Fabless companies by enabling data-driven decision-making.

Fabless 1

Advanced Visualizations and Analytics

Streamlined Analytics and Reporting:

Monitor yield data and production metrics and create detailed reports to guide strategic decisions.

Advanced PAT and SPC:

Take advantage of our PAT module with static, dynamic, multivariant and non-Gaussian analysis options. Enhance production through real time parametric SPC control charts and alert system.

Automated Data Management:

Expediate data processing through automative workflows from over 100 different data sources. Streamline operations by merging PAT and SPC modules with MES systems directly.

Early Fault Detection:

Employ advanced statistical methods to predict and mitigate potential issues before they impact production and pinpoint areas for optimization and improvement.

Fabless 1

Boosting Production Efficiency: Enhancing Yield and Speed

Improved Yield Optimization:

Identifying yield limiters and optimizing processes to enhance overall yield and product quality.

Faster Root Cause Analysis:

Quickly pinpointing the root causes of yield issues and defects to minimize production downtimes and improve product reliability.

Improved Testing Efficiency:

Optimizing testing processes, eliminating redundancy, and managing variations between test sites leading to reduced test times and costs

Reach Production Faster:

Quickly transition from design and testing to full-scale production with efficient yield management and real-time monitoring. Identifying yield limiters and optimizing processes to enhance overall yield and product quality.

Businessman,Touching,Glow,Cpu,And,Electronics,Circuit

Scalable Solution

Modular:

Tailored solutions that evolve with sector needs and are easily scalable on either On-Prem, Cloud or Hybrid infrastructure.

Custom Development:

Get extensive modeling and real-time analytics specific to the company’s requirements through our experienced team.

Why Choose yieldWerx

1. AC-Self-Service Capability for Report Creation

Self Service Capability for Report Creation

Experience flexibility and control in crafting reports to suit your unique semiconductor needs.

2. AC-Management-SCM-planning-widget

100+ Management/SCM/Planning Widgets

Access widgets to update your management, supply chain, and planning activities, improving productivity.

3. AC-Engineering & Quality Control Widgets

Engineering & Quality Control Widgets

Use specialized widgets for engineering and design, ensuring top-notch product development and quality control.

4. AC-Scalable Data Solutions

Scalable Data Solutions

Explore cloud-hosted solutions in partnership with renowned providers like Amazon Web Services and Microsoft Azure.

5. AC- PAT, GDBN outlier detection.

PAT, GDBN Outlier Detection

yieldWerx spearheads advanced PAT and GDBN techniques in outlier detection, elevating semiconductor testing to precision quality control

6. AC-Part Average testing (PAT)

Part Average Test (PAT)

yieldWerx revolutionizes chip manufacturing with zero-defect PAT solutions, enhancing quality and reliability in high-stakes industries.

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