Integrating External Data

Problem Identification:

The semiconductor manufacturing process generates abundant data, and there's a need to integrate external data sources with test data for comprehensive decision-making. Engineers and operators require the ability to integrate files to final and wafer test results, while IT administrators require a single data repository for efficient data management.

Decision to Implement yieldWerx's External Data Source Integration:

To address these challenges, the decision is made to employ yieldWerx's External Data Source Integration module. Engineers use the module to attach or link external files with wafer or lot level test results.

Data Utilization:

The module integrates external data sources with test data, enabling interactive decision-making based on comprehensive data. It stores all data in the yieldWerx repository, eliminating the need for multiple repositories and simplifying data management for IT administrators. Here are some examples of the system's results:

• Decision Making & Inspection – Manufacturing decisions rely on electronic test data and other sources like inspection tools. Engineers utilize pass/fail data from wafer maps to streamline inspection. Anomalies affecting a significant number of dies are marked as failures, updating the assembly generation map, even if they passed the initial electrical test.
• Data Sharing & Communication – The system supports real-time data sharing across different locations and time
  zones, enhancing communication and collaboration. Users can directly add comments to the system, and alerts and
  reports can be set up to keep relevant individuals informed about the process.
• Data Labeling & Representation – Labels can be added to data logs and lots for easy future reference. Data is visually
  represented in reports, aiding in clear communication and easy identification of issues.

Root Cause Analysis and Resolution:

By leveraging yieldWerx's External Data Source Integration, engineers and IT administrators can effectively address issues and discrepancies in data. The system promotes quick and efficient communication, enabling teams to resolve problems promptly.

Continuous Monitoring and Improvement:

yieldWerx's External Data Source Integration module is used for continuous data integration and monitoring, leading to more accurate and informed decision-making in the semiconductor manufacturing process.