Overall Equipment Efficiency (OEE) System

The goal is to boost production efficiency, diminish equipment downtime, and improve product quality by implementing yieldWerx's OEE system. This system seamlessly consolidates data from multiple equipment parameters, offering real-time monitoring and analysis, allowing engineers and operation managers to make more informed decisions, plan aintenance activities efficiently, and proactively take preventive measures to avoid potential yield losses.

Scenario:

  • Problem Identification:

    A Production Manager notices decreased efficiency in the production line, with signs of unexpected downtimes, lower yields, and increased cycle times.

  • Decision to Implement OEE System:

    To address these challenges, the decision is made to implement yieldWerx's OEE system. Engineers and Quality Control teams use the OEE Management module to aid in daily tasks. They use the system to monitor equipment uptime, idle time, and error states, and to correlate this data with test data.

  • Data Utilization:

    The yieldWerx OEE system offers an intuitive interface for viewing both real-time and historical data. This includes a variety of critical parameters such as equipment status, performance metrics, and quality indicators. Here are some examples of OEE results:

    • OEE Score – overall equipment efficiency value calculated from multiple metrics
    • Equipment States – metrics encompassing Uptime, Downtime, Idle Time, and Error State
    • Testing Throughput – Represents the average number of lots or units tested, highlighting the efficiency and capacity of the testing process
    • Quality Metrics – Includes measures such as the defect rate among produced units
    • Predictive Maintenance Indicators – Alerts indicating potential equipment failure based on data analysis, aiding in planned maintenance and minimizing unexpected downtime
  • Root Cause Analysis and Resolution:

    With the aid of the yieldWerx OEE system, the teams are able to identify the root causes of production inefficiencies. The system's AI capabilities predict potential equipment failures, enabling preventive maintenance actions that reduce unexpected downtimes.

  • Continuous Monitoring and Improvement:

    The yieldWerx OEE system is leveraged for continuous monitoring of the production line's performance. It provides detailed reports and insights, which support informed decision-making and continuous improvement of the manufacturing process.

Benefits:

  • Efficiency Enhancement:

    Improved production efficiency and reduced waste are achieved with the help of the OEE system's real-time monitoring and data analysis capabilities. The OEE system allows for monitoring of equipment uptime, idle time, and error states, which can assist in boosting factory utilization by as much as 0.5% and directly increases profitability.

  • Predictive Maintenance:

    Increased equipment uptime is achieved through predictive maintenance, enabled by the AI capabilities of the OEE system.

  • Quality Improvement:

    Enhanced product quality is realized due to real-time monitoring and quick issue resolution facilitated by the OEE system.

  • Data-Driven Decisions:

    The OEE system provides real-time and historical data that drive informed decision-making.

  • Profitability Increase:

    Due to improved production line performance, profitability of the semiconductor manufacturing facility is increased.

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