Semiconductor manufacturers aim to leverage yieldWerx's suite of tools and methodologies to optimize test time during production. This includes identifying and eliminating non-failing and redundant tests, analyzing test times, monitoring production delays, and managing site-to-site variation. The goal is to enhance production efficiency, improve test reliability, and increase units per hour (UPH), thereby reducing overall test costs.
Scenario:
Adoption and Setup:
A semiconductor manufacturer looking to improve production efficiency adopts yieldWerx. They set up the system to monitor test times, track UPH data, and identify variations and potential slowdowns in the production process.
Test Analysis:
The manufacturer uses yieldWerx to identify tests that consistently pass. These tests are suggested for elimination to avoid unnecessary testing. Similarly, the system pinpoints redundant tests for potential removal.
Test Time and UPH Tracking:
yieldWerx treats test time as a crucial parameter, delivering trend analysis and grouped data to enhance efficiency. The system also tracks UPH data, associating enhancements in UPH with improvements in test time.
Production Monitoring:
The platform visualizes delays in production from wafer to wafer and datalog to datalog, aiding in identifying and addressing production slowdowns.
Site-to-Site Variation Management:
yieldWerx identifies variations between testing sites that could cause units to fail incorrectly, providing insights to improve the reliability and efficacy of parallel testing.
Test Resequencing and Parallel Testing:
The system provides data on how test time aligns with bin numbers, aiding in resequencing tests for quicker failure detection. It also highlights the potential for reducing test time through parallel testing.
Benefits:
Efficient Testing and Test Time Analysis:
yieldWerx identifies consistently passing and redundant tests, suggesting their elimination to avoid unnecessary testing. The
system also delivers trend analysis and grouped data on test times, ultimately enhancing production efficiency.Production Delay Monitoring:
The platform visualizes production delays, aiding in identifying and addressing slowdowns.
Site-to-Site Variation Management:
yieldWerx provides insights into variations between testing sites, improving the reliability and efficacy of parallel testing.
Test Resequencing and Parallel Testing:
The system aids in resequencing tests for quicker failure detection and underscores the potential for reducing test time
through parallel testing.