End-to-end Semiconductor Data Analytics and Traceability Solutions For Multi-Chip Packages
Efficient test data integration is crucial for producing reliable multi-chip packages (MCPs. However, fabless companies, IDMs and OSATs face significant challenges in handling diverse test data formats associated with individual…
Semiconductor Traceability Using Lot Genealogy For Multi-Chip Modules
Multi-chip modules involve intricate workflows where devices traverse multiple stages, interact with other components, and integrate into sophisticated packages. However, this complexity brings significant challenges when it comes to lot…
How to Deal with the Challenges of MEMS Test Data Management and Yield Analysis
MEMS (MicroElectroMechanical Systems) are marvels of modern engineering. They blend mechanical and electrical components to enable advanced technologies like LiDAR, medical imaging, accelerometers, microphones, and pressure sensors. While their design…
Golden Eye: Enhancing Semiconductor Yield with Automated Optical Inspection Data
Automated optical inspection (AOI) is a powerful quality improvement tool for screening out dies with any visual defect. It uses high-speed cameras, special lights, and smart software to analyze pictures…
Ultimate Guide to Outlier Detection Using Part Average Testing
What is Part Average Testing PAT? Hidden reliability issues in ICs often remain undetected during production, only to appear once the chip is in use, potentially leading to costly system…
Understanding the Significance of STDF Data in Semiconductor Testing
Accurate and efficient test data management is crucial in the semiconductor industry for maintaining high yields and ensuring product quality. Among the various formats used to store test data, the…
Overcoming Semiconductor Yield Management Challenges Using AI and ML
The semiconductor industry has come a long way from the days of simply sorting “good units” from “bad units.” Today, yield analysis dives deep into data science, uncovering many factors…
A Guide to Implementing Yield Management Software in the Semiconductor Industry
Optimizing yield is essential for operational efficiency and financial success. Yield management software significantly addresses these challenges, utilizing data analytics and machine learning to improve defect detection and process control….
Best Practices for Sensing Failures in Automotive ICs
The integration of semiconductor integrated circuits (ICs) in automotive systems has significantly advanced vehicle functionality and performance. These ICs are vital for a broad range of operations, from engine management…
Why is Semiconductor Wafer Inspection Important?
Wafer inspection is one of the most remarkable steps in the production of semiconductor devices, as it verifies the accuracy and functionality of the wafers, which serve as the basis…
Multi Variant Part Average Test (MVPAT) for Refined Semiconductor Chip Manufacturing Analysis
The Multi Variant Part Average Test (MVPAT) is an innovative chip manufacturing analysis approach focusing on advanced quality control through multivariate testing and data-driven manufacturing, particularly for automotive electronics. MVPAT…
Wafer Map Calculators: Things You Should Know
Wafer map calculators are important for semiconductor manufacturing, playing a key role in optimizing production outcomes and improving yield. These calculators facilitate the gross die per wafer calculation, yield improvement,…