Statistical Process Control
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YieldWerx
SPC monitoring measures variations in production material for unexpected deviations. yieldWerx Enterprise performs SPC analysis and notifies staff when an unexpected deviation occurs. The yieldWerx Enterprise solution offers reporting tools…
Operations, Quality And Reliability
Production Yield Reporting
by
YieldWerx
yieldWerx Enterprise excels at building standard production yield reports by vendor, device, lot, operation, etc. and managing access to these reports. Extending your team to include suppliers to review the…
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Advanced Characterization Management
Advanced Outlier Detection
automotive benchmarks
Big Data
big data analytics
Data Analytics
Die Genealogy Data
GDBN
Global Supply Chain
Good Die Bad Neighborhood
Lot Identification
Outlier Detection
Part Average Testing
PAT
Quality Control
QuickLogic
Rectify Yield Issues
root-cause analysis
Root Cause Analysis in Semiconductor
semiconductor big data
Semiconductor Data
Semiconductor Data Analysis
Semiconductor Manufacturing Processes
Semiconductor Quality
semiconductor testing
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Semiconductor Yield Managment
STDF
wafer handling
wafermap
Wafer Map Analysis
Wafer Maps
wafer tools
Wafer Yield
Wafer Yield Management
yield enhancement
Yield Issues
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yield management solution
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yieldWerx
yieldWerx Enterprise
YMS
YMS Solution
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