Transform Data into Decisions in Semiconductor Manufacturing with yieldWerx
Maximize semiconductor production with yieldWerx: boost yield & quality by 50%, and improve productivity for engineers.
Automatic data collection and 24/7 monitoring of yield and quality
Discover yieldWerx modules, integrating analysis and decision-making tools for outlier detection, escape prevention, and adaptive semiconductor testing. Maximize yield, enhance productivity, and customize to meet your needs. Access from any device to improve operations and product performance.
Transform Data into Decisions in Semiconductor Manufacturing with yieldWerx
Maximize semiconductor production with yieldWerx: boost yield & quality by 50%, and improve productivity for engineers.
Automatic data collection and 24/7 monitoring of yield and quality
Discover yieldWerx modules, integrating analysis and decision-making tools for outlier detection, escape prevention, and adaptive testing. Maximize yield, enhance productivity, and customize to meet your needs. Access from any device to improve operations and product performance.
Automated Data Loading
Automatic data loading from over 70 different data types, improving engineer productivity by 10x
24/7 Monitoring of Yield
Ensure device safety from test to package, the last step before customer handoff & supply chain.
Reporting & Analytics
Automates front/back-end data for quick, advanced analytics in yield, diagnostics, and root causes.
Test Operations
Automate test data analysis tools to spot stats affecting yield, quality, or OEE in your supply chain.
Assembly Operations
Track wafers & chips through assembly & packaging with or without ECID to boost transparency & speed.
Data Sources
Track data from Wafer Fab, Assembly, Test, including Final Test, Bin, Parametric, WAT, and PCM.
Lot Genealogy
Traces the path of semiconductor components from fabrication to final test for precise analysis and quality enhancement.
yieldWerx Enterprise Capabilities
Production Stage
Comparative Site Assessment:
Stay vigilant about site performance concerns with automated site-by-site analysis
In-Depth Wafer Analysis:
Gain insights through wafer mapping, parametric assessment, bin analysis, and yield evaluation, with the capability to stack multiple wafers simultaneously.
Correlations
Capability to establish cross-work correlations between performance metrics across various fab and wafer sort and final test stages.
Benefits of yieldWerx Enterprise for Your Organization
Fast and Scalable
Our scalable database accommodates from gigabytes to terabytes, analyzing millions of units instantly and adapting as your company grows.
Automated alerts
Streamline works for product and test engineers by sending automated alerts, notifications, and daily reports about yield, bins, and tests directly to their phones and emails, simplifying the process remarkably.
On-prem or Cloud Deployment
yieldWerx’s cloud-based deployments enable engineers to gain the flexibility to monitor production from any location, on any device, coupled with the ease of quick setup on our platform.
yieldWerx Enterprise Capabilities
Characterization Stage
Parametric & Bin Analysis:
Delve into a detailed analysis of parameters and tests, incorporating various drill downs, wafer maps, and reports.
Efficient Drift Analysis:
Rapidly examine drift in all tests,
NPI Process Acceleration:
Expedite NPI with a virtual retest and outlier analysis, creating collaborative reports with colleagues.
yieldWerx Enterprise Capabilities
Production Stage
Statistical Bin Limits (SBL) and Statistical Yield Limites (SYL):
Efficiently calculate and store SBL & SYL limits interactively, simplifying the process.
MES Integration and Dashboard for Lots on Hold:
Create dedicated yield data dashboards that display alerts related to materials placed on hold, allowing users to bookmark and access them conveniently.
Automated Outlier Detection:
Utilize both public domain algorithms and custom algorithms, including yieldWerx PAT and DPAT, to automatically identify outliers
Flexible Licensing Options for Semiconductor Operations
yieldWerx delivers a scalable, cost-effective solution for business growth. Select only needed features for a modular setup that meets your needs, promising a 5x ROI and 10x productivity boost. yieldWerx offers adaptable packages for all clients, from startups to large corporations.
yieldWerx Enterprise Capabilities
Production Stage
Comparative Site Assessment:
Stay vigilant about site performance concerns with automated site-by-site analysis
In-Depth Wafer Analysis:
Gain insights through wafer visualization, parametric assessment, bin analysis, and yield evaluation, with the capability to stack multiple wafers simultaneously.
Correlations
Capability to establish cross-work correlations between performance metrics across various fab and wafer sort and final test stages.
Benefits of yieldWerx Enterprise for Your Organization
Fast and Scalable
Our scalable database accommodates from gigabytes to terabytes, analyzing millions of units instantly and adapting as your company grows.
Automated alerts
Streamline works for product and test engineers by sending automated alerts, notifications, and daily reports about yield, bins, and tests directly to their phones and emails, simplifying the process remarkably.
On-prem or Cloud Deployment
yieldWerx’s cloud-based deployments enable engineers to gain the flexibility to monitor production from any location, on any device, coupled with the ease of quick setup on our platform.
yieldWerx Enterprise Capabilities
Characterization Stage
Parametric & Bin Analysis:
Delve into a detailed analysis of parameters and tests, incorporating various drill downs, wafer maps, and reports.
Efficient Drift Analysis:
Rapidly examine drift in all tests,
NPI Process Acceleration:
Expedite NPI with a virtual retest and outlier analysis, creating collaborative reports with colleagues.
yieldWerx Enterprise Capabilities
Production Stage
Statistical Bin Limits (SBL) and Statistical Yield Limites (SYL):
Efficiently calculate and store SBL & SYL limits interactively, simplifying the process.
MES Integration and Dashboard for Lots on Hold:
Create dedicated dashboards that display alerts related to materials placed on hold, allowing users to bookmark and access them conveniently.
Automated Outlier Detection:
Utilize both public domain algorithms and custom algorithms, including yieldWerx PAT and DPAT, to automatically identify outliers
Flexible Licensing Options for Semiconductor Operations
yieldWerx delivers a scalable, cost-effective solution for business growth. Select only needed features for a modular setup that meets your needs, promising a 5x ROI and 10x productivity boost. yieldWerx offers adaptable packages for all clients, from startups to large corporations.
Enhance your semiconductor operations with accuracy and clarity
Maximize the efficiency of your semiconductor manufacturing with yieldWerx Enterprise. Explore a suite of modules designed to optimize your engineering roles, streamline data processing, and deliver actionable insights directly to your workstation or smart device. Boost your manufacturing precision now!