yieldWerx Enterprise comprises a functionally feature-rich suite of modules that supports semiconductor manufacturing engineers and analysts in their daily activities. Core yieldWerx offers the fundamental modules upon which we provide solutions and capabilities that meet customer needs. Other modules can be selected based on the customer’s environment and needs. All modules seamlessly link and integrate with each other. Their common User Experience facilitates customers adding new modules. The web-enabled interface allows functionality to be platform independent as well as accessible from any smart device. Customers can analyze and make decisions on the spot without being tethered to their workstation
Core yieldWerx 2.0
Setting up and maintaining a company’s semiconductor manufacturing data system provides data upon which an engineering team performs data analysis. Go wrong here and you waste an engineer’s time. Developing a core set of yield analysis reports and basic analysis capabilities sets the stage for engineers and analysts to succeed. Assessing factory capacity based upon yield trends enables planners to plan for the next quarter. A yield and test management system alerts your engineering team regarding possible manufacturing issues—yield excursions, cluster defects, probe card issues, etc; and it provides engineers the analysis tools to investigate these types of issues further.
Test manufacturing floors represent a complex system as there are multiple products, multiple testers and other assembly and test equipment on the floor that all generate data. Couple this with data being ingested in from other 3rd party contractors such as those that bump wafers. Given the volume and mix of data from products on the shop floor this necessitates the automation of data management. Operators move wafer boats and bundles of package units around and load them into test cells. Errors can occur in with the manual keying of identity such as lot ID, product ID, test program. Such errors will impact the most basic of yield reports. Data from a test cell will be processed and uploaded to the manufacturing execution system (MES); network hiccups can occur in the transfer of data. These scenarios illustrate just two types of events that lead to data integrity issues; and all possible data integrity issues need to be considered when automating the data management. Core yieldWerx’s set of modules possesses the capabilities to support the management of the raw test data so that subsequent analysis is done only on data that can be trusted by engineers.
Our core package also provides engineering teams and analysts the fundamental reporting analysis modules that support their roles comprehending and improving product yields, test costs, factory automation and test floor operations. Transforming data into standard data formats for an engineer’s favorite tools (e.g. SAS) provides complete flexibility for subsequent data processing. The package integrates with standard test data formats (e.g. STDF), manufacturing execution systems (MES) and business IT systems (e.g. SAP).
Read the specifics about each module. You will learn how Core yieldWerx sets up for success those that manage the data and those that analyze the data.
Automated Data Loading
This module fully supports automated data loading. Staff define the business rules to determine what is good vs bad data and to discern what is engineering vs. production data. Comes with the ability....
Reporting & Analysis
This module delivers production yield reports to its platform users, including product, manufacturing, and yield engineers. Additional internal and external stakeholders can access these reports using...
Data Archive/Purge Module
This module provides a full set of data archive and purging settings which permit setting a data retention policy at the granularity needed for your product’s point in its development life cycle and your product’s...
Standard Data Access For External Tools
Provision for SAS, JMP, Spotfire, Excel, Tableau, like tools to access data from standard or customized data views...
Yield Calculation Flexibility
Ability to determine what rules should be applied to calculate yield, especially for Final Test data as well as for Wafer Sort where GDPW values are used over tested die...
Raw Data Monitoring
Daily/Hourly Email/Email Digests, Dashboards & Real Time alerts on any raw data that failed to load to production databases. Ability to rapidly reload failed raw data files after corrections have been applied...
Lot Genealogy
Automatically generate Lot Genealogy from Fab to Wafer Sort/Assembly Test right down to the Die Level. Allows analysis to be performed top down OR bottom up...