Metrology and Defect Data Management

Defect Data Management Module: Streamlining Yield Improvement

yieldWerx's Defect Data Management module is a comprehensive solution designed for semiconductor manufacturers to optimize yield through meticulous management and analysis of Metrology/Defect data. This module enhances defect classification carry-over analysis and enables effective correlation of defect data with test results.

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Optimize Yield with Integrated Metrology and Defect Analysis

Integrated Metrology and Defect Data Analysis:

Efficiently manage metrology and defect data, utilizing parametric information from linewidths and transistor features to improve feedback to fab partners.

Advanced Defect Classification:

Classify defects accurately using images from inspection equipment, enabling product and quality engineers to identify and address yield-impacting issues.

Defect Carry-Over Analysis:

Assess particles and their impact on wafer processing, monitoring key indicators for quality control and process excursion detection.

Yield Improvement through Data Correlation:

Correlate defect data with wafer probe results and wafer maps, driving down defectivity rates for substantial yield improvement and reduced escapes.

Enhanced Data Connectivity:

Connect die-level data through the final test, leveraging unique IDs to trace and analyze defects across the entire manufacturing process.

image2

Defect Data Management Module: Streamlining Yield Improvement

yieldWerx's Defect Data Management module is a comprehensive solution designed for semiconductor manufacturers to optimize yield through meticulous management and analysis of Metrology/Defect data. This module enhances defect classification carry-over analysis and enables effective correlation of defect data with test results.

image1

Optimize Yield with Integrated Metrology and Defect Analysis

Integrated Metrology and Defect Data Analysis:

Efficiently manage metrology and defect data, utilizing parametric information from linewidths and transistor features to improve feedback to fab partners.

Advanced Defect Classification:

Classify defects accurately using images from inspection equipment, enabling product and quality engineers to identify and address yield-impacting issues.

Defect Carry-Over Analysis:

Assess particles and their impact on wafer processing, monitoring key indicators for quality control and process excursion detection.

Yield Improvement through Data Correlation:

Correlate defect data with wafer probe results and wafer maps, driving down defectivity rates for substantial yield improvement and reduced escapes.

Enhanced Data Connectivity:

Connect die-level data through the final test, leveraging unique IDs to trace and analyze defects across the entire manufacturing process.

Why Choose Defect Data Management module by yieldWerx

The Defect Data Management module by yieldWerx empowers semiconductor companies with the tools to manage complex defect data efficiently, facilitating significant advancements in quality control, yield improvement, and reduction of escapes. This module is essential for manufacturers aiming to achieve and maintain high standards of product quality and reliability.

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