From superconducting circuits and silicon spin structures to trapped-ion micro-arrays and integrated photonic quantum ICs, quantum computing is moving from research to real-world adoption and reaching a velocity where scaling lab technology will be critical to match the speed of an AI and Photonics-fueled semiconductor economy. Implementing robust quantum computing data analytics early is essential to bridge this transition smoothly.
Quantum hardware is one of the most heterogeneous device classes ever brought to production: qubits, control electronics, packaging, and cryogenics all have to work together across a temperature range spanning 300K down to millielectronvolt scale cooldowns. Teams that built their analysis around lab scale scripts and spreadsheets hit a wall the moment they try to scale, losing visibility into where yield is lost and why. yieldWerx brings a proven enterprise quantum yield management platform, already validated in analogous heterogeneous device ramps like co-packaged optics, to make that leap from lab to volume measurable and controllable.
Solving these challenges requires a single enterprise data layer, automated analytics, and full genealogy tracking purpose built for the next generation of quantum hardware, exactly where yieldWerx’s platform delivers.
Results scattered across STDF, ATDF, CSV, cryo, and optical test systems with no unified view or centralized quantum test data analytics.
Root cause work that depends on custom scripts doesn’t scale without adding headcount or slowing lab-to-volume quantum manufacturing.
Without qubit yield correlation and defect overlay analysis, teams can’t pinpoint what’s driving loss.
Prototype recipes need to become repeatable, monitored production processes supported by automated yield management software.
Regulated end markets demand audit grade lineage and quantum IC failure analysis genealogy from wafer to package to system.
Unifies radically different parametric test logs across mK cryo, CMOS wafer sort, optical trap arrays, and photonic probe maps into a single analytics engine
ANALYTICS IN ACTION
A sample of the analyses yieldVerx runs automatically across test, process and measurement data – illustrative examples on representative data.
Spatial signatures & zonal yield expose edge-ring loss.
Live drift detection with control-limit alarms.
Rank loss drivers to focus root-cause where it pays.
Distributions vs. spec limits, with Cpk / Ppk capability.
Correlate parameters to coherence & yield at scale.
Track coherence across the 300K-mK cooldown, per site.
yieldWerx directly resolves the core pain points of quantum compute scaling by providing a unified enterprise data management layer equipped with native loaders for STDF, ATDF, CSV, cryogenic, optical, and custom test logs. Whether managing
superconducting multi-chiplet modules, high-density silicon spin wafer maps, or trapped-ion chiplet assembly data, the
platform standardizes disparate test feeds into a single analytical pipeline.
Designed to accelerate lab-to-volume quantum manufacturing, the platform delivers over 100 pre-built automated reports and lights-out analytics, including advanced quantum computing chip yield analytics, allowing engineering teams to scale throughput without adding headcount. To eliminate quantum chip yield analytics bottlenecks and yield loss, yieldWerx combines correlation, commonality, defect overlay, and multivariate Part Average Testing (PAT) to precisely pinpoint root causes across complex qubit fabrication stages. For volume production ramps, especially next-generation quantum AI chip yield analytics applications, the platform integrates real-time Statistical Process Control (SPC), Statistical Bin Limits (SBL), Statistical Yield Limits (SYL) auto-holds, and native MES compatibility. Complete with audit-grade genealogy tracking for regulated automotive and aerospace/defense markets, smart multi-site wafer-map merging across cooldown passes, and flexible cloud, on-premise, or isolated hybrid deployments, yieldWerx establishes the essential quantum yield management and cryogenic test data analytics foundation required for commercial-scale quantum hardware.
Multi-chiplet packaging, microwave parametric test, pre/post-cooldown yield correlation, interposer loss tracking
Correlates 300K room-temperature WAT/PCM wafer sort data directly with mK cryogenic test logs to screen out defective interposers before costly dilution refrigerator cooldowns.
Native CMOS wafer-map analytics, WAT/PCM parametric correlation, spatial defect overlay, gate oxide uniformity
Leverages high-density CMOS wafer map analytics to isolate spatial fab defects, track gate oxide thickness variation, and calculate yield across billion-transistor arrays.
Micro-fabricated trap-die assembly, optical & laser characterization, multi-site system genealogy, laser gate fidelity logs
Merges laser gate fidelity logs, optical coupling test feeds, and micro-trap assembly data into a unified genealogy view to track die-to-array yield loss.
On-chip waveguide loss tracking, laser-to-photonic IC coupling, phase shifter alignment, optical probe map correlation
Analyzes optical wafer-level probe (WLP) data alongside electrical parametric feeds to monitor waveguide transmission loss, thermal tuning range, and die-l
Co-packaged optics pioneers such as Ayar Labs faced the same leap quantum faces now – a new, heterogeneous device class scaling from lab prototypes to volume. yieldWerx was the data & yield layer that made that ramp measurable.
Unifies optical, electrical & assembly test (STDF / ATDF + custom loaders)
Qubits, control lines, packaging and cryogenics
Prototype recipes must become repeatable, monitored processes
Edge, coupling and coherence map straight onto wafer & zonal analytics
Localizes loss and maintains yield through ramp
Needs the same merge, correlation & genealogy
Corner / temp / voltage sweeps; parametric distributions per qubit type (superconducting coherence times, silicon spin fidelity, trapped-ion laser gate metrics).
Yield by wafer, lot & site; good-die mapping; binning and pareto.
Fab/process to test correlation; defect overlay; commonality & root-cause.
Bin & parametric wafer maps; spatial signatures; zonal analysis for CMOS-based silicon spin and planar trapped-ion chips.
Real-time SPC, drift & coherence trending,control limits, alerts.
Multi-temperature merge (300K to mK); cooldown & pass correlation.
T1 / T2 stability, requal, audit-grade traceabilityfor regulated markets.
Wafer to die to package to system lineage acrossevery work center.
Automated dispositioning, anomaly detection, correlation at scale.
Discover how our cutting-edge analytics can revolutionize
your semiconductor operations. Schedule a demo today!
Last Updated: June 2, 2026
Welcome to yieldWerx.com (the “Site”), operated by yieldWerx, Inc. and its affiliates (“yieldWerx,” “we,” “us,” or “our”). These Terms of Use (“Terms”) govern your access to and use of our website, web portals, customer platforms, evaluation tools, and related digital services (collectively, the “Services”).
PLEASE READ THESE TERMS CAREFULLY BEFORE USING THE SERVICES. BY ACCESSING, BROWSING, OR USING YIELDWERX.COM OR ANY ASSOCIATED PORTALS, YOU ACKNOWLEDGE THAT YOU HAVE READ, UNDERSTOOD, AND AGREE TO BE BOUND BY THESE TERMS AND OUR PRIVACY POLICY. IF YOU DO NOT AGREE, DO NOT ACCESS OR USE THE SERVICES.
1.1 Website & Portal Scope: These Terms apply to all visitors, registered users, and entities accessing yieldWerx.com, including public marketing pages, client portals, resource hubs, and evaluation or demo environments.
1.2 Enterprise Master Agreements: If you or your employer have executed a separate written Master Services Agreement (MSA), Software License Agreement (SLA), or Non-Disclosure Agreement (NDA) with yieldWerx, the terms of that specific written agreement shall govern your commercial subscription or deployment of yieldWerx software. In the event of any direct conflict between these Website Terms and your executed enterprise agreement, the executed enterprise agreement shall take precedence.
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When using the Site or any yieldWerx platform, you expressly agree NOT to:
System Interference: Conduct, request, or facilitate any load testing, stress testing, penetration testing, vulnerability scanning, or denial-of-service (DoS) attacks on the Site or related cloud infrastructure without prior explicit written authorization from yieldWerx.
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Evaluation Purpose Only: You may use the Evaluation Services solely for testing and evaluating the platform’s suitability for your internal business requirements.
No SLAs or Guarantees: Evaluation Services are provided strictly “AS-IS” without technical support, uptime guarantees, or maintenance obligations.
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If you have any questions, concerns, or legal inquiries regarding these Terms or the Site, please contact us at:
yieldWerx, Inc.
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Disclaimer: This document is a baseline template tailored for yieldWerx.com based on industry standards. Because enterprise semiconductor analytics companies handle sensitive IP and complex enterprise sales, you should have your corporate legal counsel review and finalize this document prior to publishing it on your website.
Effective Date: Jan 1, 2024
Last Updated: July 22, 2026
At yieldWerx, Inc. (“yieldWerx,” “we,” “us,” or “our”), we respect your privacy and are committed to protecting the personal information collected through our website, portals, evaluation sandboxes, and digital services (collectively, the “Site”).
This Privacy Policy explains how we collect, use, disclose, and safeguard personal information when you visit yieldWerx.com, request product demos, download technical datasheets, register for portal access, or interact with our enterprise yield management services.
1.1 Customer Data (As a Data Processor): In providing enterprise semiconductor yield management platforms, yieldWerx processes datasets on behalf of our corporate clients (e.g., wafer test data, STDF logs, manufacturing metrics). Our clients control this “Customer Data.” The collection, security, and processing of Customer Data are governed by our client contracts (Master Services Agreements and Data Processing Agreements) and our clients’ privacy policies—not this public Privacy Policy.
1.2 Visitor Data (As a Data Controller): This Privacy Policy specifically governs personal information collected directly from individuals visiting yieldWerx.com, downloading resources, or interacting with our marketing and support teams.
We collect information directly from you, automatically through your device, and from reputable commercial third parties.
A. Information You Voluntarily Provide
Business Contact Information: Name, job title, corporate email address, phone number, company name, primary industry/domain, and geographic location when you fill out contact forms, schedule demos, or request technical datasheets.
Account Registration Credentials: Username, password, and professional background details created to access yieldWerx client portals, software downloads, or developer/evaluation environments.
Inquiries & Communications: Content of messages, support tickets, survey responses, or email feedback sent to our teams.
B. Information Collected Automatically
Whenever you navigate yieldWerx.com, our systems automatically log standard web parameters, including:
Device & Environment Variables: IP address, operating system, browser type, screen resolution, MAC address, and device type.
Usage & Telemetry Data: Pages visited, duration of visits, referring URLs, clickstream paths, resource downloads, and error logs.
Cookies & Tracking Technologies: We use strictly necessary, performance, functional, and targeting cookies, as well as pixel tags/web beacons, to analyze traffic patterns and improve site performance.
C. Information from Third Parties
We may receive basic professional lead information (e.g., job titles, business email addresses) from event partners, joint-marketing webinars, or B2B intelligence services to identify prospective enterprise clients.
We process personal information under valid legal bases (including performance of a contract, legitimate business interests, legal compliance, or explicit consent) for the following purposes:
yieldWerx does not sell, rent, or trade your personal information to third parties for monetary consideration. We share information only under the following circumstances:
Affiliated Entities: With our global subsidiaries and corporate affiliates to support international sales, service delivery, and enterprise support.
Third-Party Service Providers: With vetted vendors who perform business operations on our behalf (e.g., website hosting, CRM platforms, email delivery, security monitoring, and analytics). These providers are contractually obligated to protect your data and may only use it to perform specific tasks for yieldWerx.
Corporate Transactions: In connection with any merger, acquisition, financing, re-organization, or sale of company assets, subject to standard confidentiality protections.
Legal Obligations & Safety: When required by law, court order, or government subpoena, or when necessary to protect the rights, property, safety, or security of yieldWerx, our users, or the public.
You can manage or restrict cookie usage directly through your internet browser settings:
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Performance & Analytics: Helps us count visits and traffic sources to measure site performance.
Functional & Advertising: Remembers your preferences and optimizes promotional relevance.
Disabling performance or functional cookies may limit access to specific features or gated downloads on yieldWerx.com.
Security Infrastructure: We maintain organizational, technical, and physical safeguards—including encryption, firewalls, and strict access controls—designed to protect personal information against unauthorized access, loss, or alteration.
Retention Period: Personal information is retained only as long as necessary to fulfill the purposes outlined in this policy, unless a longer retention period is required or permitted by law (e.g., tax, audit, or legal defense obligations).
yieldWerx operates globally. Information collected through yieldWerx.com may be transferred to, stored, and processed in the United States or other countries where yieldWerx or its service providers maintain facilities. We implement appropriate safeguards (such as Standard Contractual Clauses) to ensure your data receives protection equivalent to applicable privacy laws in your home jurisdiction.
Depending on your jurisdiction (e.g., California/CPRA, European Economic Area/GDPR), you may hold the following rights regarding your personal information:
Right to Access / Know: Request details on the categories and specific pieces of personal information we have collected about you.
Right to Correction / Rectification: Request correction of inaccurate or incomplete personal records.
Right to Deletion / Erasure: Request deletion of your personal information, subject to legal retention exceptions.
Right to Opt-Out of Marketing: Click the “Unsubscribe” link in any promotional email to instantly opt out of marketing communications.
Non-Discrimination: We will never discriminate or retaliate against you for exercising any of your legal privacy rights.
To submit a data access or deletion request, please email us at trust@yieldwerx.com.
yieldWerx.com may contain links to external third-party sites (e.g., industry consortia, event partners, or technical standards organizations). We are not responsible for the privacy practices or content of external websites. We encourage you to review the privacy policy of any site you visit.
While this Privacy Policy primarily addresses information collected from visitors to yieldWerx.com and our public marketing platforms, yieldWerx also acts as a Data Processor for enterprise clients who subscribe to our semiconductor yield management platform.
Enterprise customers requiring a copy of our standard DPA or customized data transfer agreements may contact trust@yieldwerx.com.
yieldWerx retains personal data and information collected through our public website only for as long as necessary to fulfill the operational, legal, or commercial purposes outlined in this policy:
Marketing & Communication Data: Contact information submitted via forms (e.g., demo requests, whitepaper downloads) is retained until you unsubscribe or request deletion.
System & Audit Logs: Server logs, IP addresses, and website security records are retained for security audit purposes for up to 12 months, after which they are automatically anonymized or purged.
Enterprise Customer Production Telemetry: Parametric test logs, STDF data, and chip analytics uploaded to our platform are stored, archived, or deleted in strict compliance with the custom retention schedules defined in each client’s Master Services Agreement (MSA) and Data Processing Addendum (DPA).
We ensure complete data protection through industry-standard encryption of data in transit (using TLS, SFTP, and site-to-site VPN) and at rest. Security across our platform is strictly managed using role-based access control (RBAC) and multi-factor authentication (MFA), backed by continuous security monitoring, patch management, and vulnerability management. Additionally, physical security controls are maintained across all yieldWerx facilities.
We maintain a formal incident-response program with defined severity classifications and escalation timelines. If a security incident affecting customer data is confirmed, we commit to notifying the customer’s designated contact within 24 hours of confirmation and assigning a single named incident liaison for the duration of the event. If the investigation is ongoing, we deliver an interim update within 48 hours, followed by a full incident report detailing the root cause and remediation steps within 72 hours.
We welcome good-faith security research. If you believe you’ve found a vulnerability in a yieldWerx product or service, please report it to trust@yieldwerx.com. We investigate every report and will not pursue legal action against researchers acting in good faith.
To the extent yieldWerx processes personal information subject to the California Consumer Privacy Act (CCPA/CPRA) on behalf of Customer, yieldWerx acts solely as a Service Provider. yieldWerx shall not: (a) sell or share such personal information; (b) retain, use, or disclose personal information for any purpose other than providing the contracted services; or (c) combine personal information received from or on behalf of Customer with personal data received from other sources, except as permitted under the CCPA.
We reserve the right to update this Privacy Policy to reflect changes in our legal obligations, privacy practices, or operational services. When updates occur, we will revise the “Last Updated” date at the top of this page. Continued use of yieldWerx.com after updates are posted signifies your acknowledgment of the revised terms.
If you have questions, concerns, or requests regarding this Privacy Policy or yieldWerx’s privacy practices, please contact us at:
yieldWerx Semiconductor
Suite 202 8105 Rasor Blvd Plano, TX 75024
Attn: Privacy & Data Protection Office
Email: trust@yieldwerx.com
Website: https://yieldwerx.com
