PAT, GDBN Outlier Detection Moving Beyond Automotive
by
YieldWerx
Semiconductor testing is a walk on the tightrope because of the latent defects that emerge in chips later in their life when they are part of an end-product. That’s why…
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Recent Posts
- The Importance of Long-Term Data Archiving in The Semiconductor Test Industry
- Understanding the Significance of STDF Data in Semiconductor Testing
- Overcoming Semiconductor Yield Management Challenges Using AI and ML
- A Guide to Implementing Yield Management Software in the Semiconductor Industry
- Best Practices for Sensing Failures in Automotive ICs
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