AI-Powered PAT: A New Era of Smarter Manufacturing
For the past three decades, the Automotive Electronics Council (AEC) has utilized Part Average Testing (PAT) as the standard for statistical screening. However, technological advancements beyond Moore’s Law have outpaced…
PAT, GDBN Outlier Detection Moving Beyond Automotive
Semiconductor testing is a walk on the tightrope because of the latent defects that emerge in chips later in their life when they are part of an end-product. That’s why…