The Complete Guide to Wafer Defect Detection Using Knowledge Graphs in 2025
What do Google search, Facebookâs recommendations and modern wafer defect detection have in common? They all rely on knowledge graphs (KGs) to process intricately complex, interlinked data. What are Knowledge…
AI-Powered PAT: A New Era of Smarter Manufacturing
For the past three decades, the Automotive Electronics Council (AEC) has utilized Part Average Testing (PAT) as the standard for statistical screening. However, technological advancements beyond Moore’s Law have outpaced…