Big Data Revolution at Chip Industry’s Doorsteps
Semiconductor Manufacturing is not a stranger to “Big Data”. Intel alone manages 59 Data Centers and over 130,000 servers for its internal design and manufacturing operations. In fact, the capital…
Statistical Process Control
SPC monitoring measures variations in production material for unexpected deviations. yieldWerx Enterprise performs SPC analysis and notifies staff when an unexpected deviation occurs. The yieldWerx Enterprise solution offers reporting tools…
Customer Contractual Data Archival
Customers in the automotive, life sciences, military, aerospace & Defense, and other high-reliability industries often specify Contractual Data Archival requirements for semiconductor manufacturing data. Suppliers to these industries may be…
RMA Containment
Achieving 100% reliability is not possible in high-volume manufacturing. When a customer returns a failed device, the pressure to find and ensure any problems are contained can be intense. yieldWerx…
Fab, Probe and Final Test Yield Reporting
Semiconductor Manufacturing Process The semiconductor manufacturing process is a meticulous procedure that encompasses several steps, one of which includes the Fabrication (Fab) phase. In this phase, complex designs are created…
Production Yield Reporting
yieldWerx Enterprise excels at building standard production yield reports by vendor, device, lot, operation, etc. and managing access to these reports. Extending your team to include suppliers to review the…
Commonality Analysis, Equipment Commonality
Commonality Analysis refers to a set of techniques used to identify systematic causes of yield loss. Because of the complexity and number of process steps involved in semiconductor manufacturing, pinpointing…
Device Characterization and Correlation
Product engineers verify chip design robustness and document the variance of important electrical measurements for a new IC or process through device characterization. Characterization analysis screens for problems to ensure…
Gauge R&R ANOVA
Gauge R&R studies are critical to identifying unknown issues in measurement quality, and ANOVA is the preferred method for analyzing Gauge R& R results. ANOVA calculations are both highly detailed…
SmartLogic Data Cleansing and Mapping
One of the most challenging aspects of yield management is ensuring that data is consistent and accurate. Sifting through large volumes of data is a time-consuming task for engineers. yieldWerx…
Final Test to Probe Correlation
Because product costs are added with every step in the semiconductor supply chain, eliminating low-yielding material early in the manufacturing process optimizes overall costs. yieldWerx Enterprise can correlate Final Test…
Zonal vs. Average Process Control Monitor (PCM)
As standard wafer sizes have grown, the variation in electrical performance across a wafer has increased. Averaging the electrical results from a typical five-site Process Control Monitor (PCM) has become…