In the Semiconductor Age, billions of products worldwide depend on the reliability of ICs. The competitiveness in the semiconductor industry is extremely hard. Therefore, as an example, manufacturers are constrained to bring new products faster to the market and with improved reliabilities. However, before the volume production of a new semiconductor device can start. It is mandatory to perform electrical, optical and physical/chemical characterizations. This step involves the parallel use of many expensive tools such as secondary ion-mass spectrometers measuring for some, hundreds of thousands of parameters. Expanding complexity of chip designs and more diverse functionalities, thus, makes the characterization phase of new devices time-consuming and sophisticated.

The characterization is, however, mandatory to qualify prototypes before ramping them up for mass production. Reducing the delay between these two stages and performing accurate characterizations. It is crucial to improve the competitivity of your Fab and increase the yield of new products. Yet, old-school-based methods for processing the big data from the characterization tools aren’t suitable anymore since the automatization is only partial and the time aspect isn’t optimised.

Advanced Characterization Management

An advanced characterization management system such as provided by yieldWerx Enterprise becomes necessary for test engineers. This advanced characterization management module is necessary to quickly generate useful reports. The yieldWerx’s Enterprise device characterization module will accelerate and enhance the collaboration between departments for efficient and fast decisions concerning new products. That would be finally leading to rapid qualification. Data reports become easier with yieldWerx and three interesting features can be used for characterization purposes:

  • The Parametric Failure Report allows you to visualise the top failing tests. This is a useful tool to quickly highlight the most sensitive parameters for new products in order to collaborate with the designers and take suitable decisions.
  • With the Data Extraction, you can select the desired parameters, wafers and lots you want to compute. The selected data can be exported in many different formats for further analysis using other softwares.
  • Visualize for any test parameter the statistical results with the Data Summary option. You will be able to quickly access important data such as the standard deviation and mean.

Not only your new dies will experience a better characterization, but also these data analysis features will help you to maintain a steady and high yield level. Once the product is mature and ready for mass production.

Moreover, reports can be easily shared with engineer’s teams or managers through a real-time and yield management dashboard using Power BI®. This feature makes teamwork more dynamic since the raw data is remodeled into clean and precise graphs. Decisions happen to be more appropriate and time-saving if the problems appearing during the ramp-up stage. Therefore this could be solved much faster which leads to rapid qualification and better product quality. Your company gets benefits of an improved reputation to your clients since new products are more reliable and brought to the market earlier.

Make your characterization tools worth it with our advanced characterization management solution. So the yieldWerx will help you to efficiently sort and analyse the data. Your hardware provides in order to accelerate the characterization stage and speed the qualification process. You will ramp-up your new products faster and keep a high and sustainable yield in the future. Don’t hesitate anymore and take a 15 days free trial to explore at your rhythm all the possibilities of yieldWerx Enterprise or schedule a demo with us to get to know our product with an expert.