Zonal vs. Average Process Control Monitor (PCM)
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YieldWerx
As standard wafer sizes have grown, the variation in electrical performance across a wafer has increased. Averaging the electrical results from a typical five-site Process Control Monitor (PCM) has become…
Product Engineering
Cross-operation Correlation
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YieldWerx
Because product costs are added with every step in the semiconductor supply chain, eliminating low-yielding material early in the manufacturing process optimizes overall costs. yieldWerx Enterprise can correlate Final Test…
Test Time Optimization
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YieldWerx
Reducing valuable test time and optimizing utilization of test equipment can lead to lowered cost of goods (COGS) for semiconductor device manufacturers. yieldWerx Enterprise provides the sophisticated tools to analyze,…
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