Fab, Probe and Final Test Yield Reporting
Semiconductor Manufacturing Process The semiconductor manufacturing process is a meticulous procedure that encompasses several steps, one of which includes the Fabrication (Fab) phase. In this phase, complex designs are created…
Production Yield Reporting
yieldWerx Enterprise excels at building standard production yield reports by vendor, device, lot, operation, etc. and managing access to these reports. Extending your team to include suppliers to review the…
Commonality Analysis, Equipment Commonality
Commonality Analysis refers to a set of techniques used to identify systematic causes of yield loss. Because of the complexity and number of process steps involved in semiconductor manufacturing, pinpointing…
Gauge R&R ANOVA
Gauge R&R studies are critical to identifying unknown issues in measurement quality, and ANOVA is the preferred method for analyzing Gauge R& R results. ANOVA calculations are both highly detailed…
Cross-operation Correlation
Because product costs are added with every step in the semiconductor supply chain, eliminating low-yielding material early in the manufacturing process optimizes overall costs. yieldWerx Enterprise can correlate Final Test…
Test Time Optimization
Reducing valuable test time and optimizing utilization of test equipment can lead to lowered cost of goods (COGS) for semiconductor device manufacturers. yieldWerx Enterprise provides the sophisticated tools to analyze,…
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