yieldWerx provides advanced functionalities to the users with its modern yield management solution. Our Yield Management System’s advanced modules offer fast data insights while saving manual labor and time. yieldWerx’s functionalities like Custom Limits Manager, Defect Data Management, Inspect Image Element Memory/Optical Bit Map, Overall Equipment Efficiency, Real-time Handler and Probe Control Module help semiconductor companies manage and analyze their data efficiently.
Custom Limits Manager
Ability to create custom sets of limits or import them and then manage them in yieldWerx. Then allow users to use custom limits to perform analysis instead of having to enter in custom limits manually....
Defect Data Management
Ability to manage Metrology/Defect data, perform defect classification, defect carry-over analysis, and correlate defect data with test data....
Inspect Image Management
Automatically collect inspection data and other images and associate this data to wafers/die/units and associated manufacturing equipment. For delivery of assembly maps use the data to apply business rules...
Memory/Optical Bit Map
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Ability to automatically construct image maps for memory or optical arrays using failing data and then running pattern recognition on it to determine failure types and to execute corresponding....
Overall Equipment Efficiency
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Equipment utilization and efficiency monitoring. Monitoring of Equipment Uptime, Idle Time, In Error State. Integration with MES platform. Data used for correlation with Test....
Real-Time Handler and Prober Control Module
Ability to automatically control the prober. Collect real-time test data and make decisions that change the probing pattern.....
STDF Data Analysis Tool
This module makes STDF data analysis simple, enabling real-time upload, viewing, and modification of test files and STDF raw data to improve yields with...
Test Program Management
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This module manages test program releases to both internal test facilities and OSAT’s. Supports creating the workflows that enable systematic and documented processes...