Test Time Optimization
by
YieldWerx
Test Engineering
Reducing valuable test time and optimizing utilization of test equipment can lead to lowered cost of goods (COGS) for semiconductor device manufacturers. yieldWerx Enterprise provides the sophisticated tools to analyze, correlate and monitor bin yields to remove redundant or unnecessary tests. These tools can provide significant cost savings, while maintaining confidence in outgoing product quality.
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Tags
Advanced PAT
Automated Reports
Automated Testing System
Big Data
big data analytics
Big Data Systems
Characterization
Chip Production
Contractual Data Archival
CSV
DPAT
Efficient Characterizations
Fabless Companies
Fabrication
Final Test
GDBN
GDNB
Genealogy Analytics
NNR
Outlier Detection
Outliers
Parametric
PAT
Process Capability Index (CPK)
Quality Control
Real-time Tracking of Yield Issues
Root Causes of Yield Losses
Semiconductor Production
semiconductor testing
Semiconductor wafer manufacturing
Semiconductor Yield Managment
Semiconductor Yield Strategy
SPAT
SPC Analysis
SPC Monitoring
wafer handling
wafer tools
Yield Engineering
yield enhancement
Yield Tracking Systems
yieldWerx Enterprise Modules
yieldWerx Enterprise Software
YMS
YMS Solution Components
Zero Defect Tools