SPC monitoring measures variations in production material for unexpected deviations. yieldWerx Enterprise performs SPC analysis and notifies staff when an unexpected deviation occurs. The yieldWerx Enterprise solution offers reporting tools and custom dashboards for viewing control charts, yield trends, and monitoring Cpk (Process Capability Index) during production.
Customers in the automotive, life sciences, military, aerospace, and other high-reliability industries often specify archival requirements for semiconductor manufacturing data. Suppliers to these industries may be contractually obligated to store manufacturing data for extended periods of time. yieldWerx Enterprise supports these archival needs based on individual customer and product requirements.
Suppliers to the automotive and other high-reliability industries must often contractually adhere to a stringent set of guidelines that include Part Average Testing (PAT). PAT guidelines are very difficult to adhere to, especially at high volumes, without a sophisticated YMS system. yieldWerx Enterprise provides the sophisticated workflows and tools needed to satisfy PAT test and reporting requirements.
Achieving 100% reliability is not possible in high-volume manufacturing. When a customer returns a failed device, the pressure to find and ensure any problems are contained can be intense. yieldWerx Enterprise quickly identifies the lots, wafers, and other variables common to a failed device for rapid assessment of exposure risk.