Semiconductor Yield Analysis Software

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Ideal ATE Data Analysis Tool

For decades engineers have used STDF as the standard format for ATE test output- data logs, and yieldWerx automatically parses this format. However, with the increase in engineer’s usage of the general data record type (GDF) this usage often results in every....
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Commonality Analysis, Equipment Commonality

Commonality Analysis (CA) refers to a set of statistical techniques to identify any systematic causes of yield loss. These techniques typically use association rules and/or ANOVA (Analysis of Variance) to identify manufacturing variables that are common to failed devices.....
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Gauge R&R ANOVA

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This module provides a full set of data archive and purging settings which permit setting a data retention policy at the granularity needed for your product’s point in its development life cycle and your product’s...
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