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yieldWerx Enterprise
Automated yield monitoring
Reporting & Analysis
Data Archival
Data Insertion Monitoring
3rd Party Integration
Yield Calculation Flexibility
Lot Genealogy
Volume Production
Automated Assembly Map Generation (AMP)
GDBN
Cross Work Center Correlation
Auto Lot Disposition (ALD)
yieldWerx BI Dashboards
Part Average Test (PAT)
Smart Wafer Merge (SWM)
SPC/SBL/SYL
Wafer or Reticle Map Definition
NPI
Test Program Custom Limits
Metrology and Defect Data Management
Inspect Image Management
Optical Memory Mapping
Overall Equipment Efficiency (OEE)
Realtime Wafer Prober Control (WPC)
STDF Data Analysis Tool
Engineering Roles
IC Design Characterization Analysis Software
IT Admin
Semiconductor Field Failure Management Software
Product Engineer
Quality Engineer
Test Equipment Engineer
Test Floor Operations
Semiconductor YMS In Supply Chain
Semiconductor Yield Enhancement Software
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Aerospace Defense Semiconductor Quality Assurance
Semiconductor Quality Assurance Solutions
Yield In Semiconductor Manufacturing
Yield Management Software for Fabaless Companies
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Optimizing Yield
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Overall Equipment Efficiency (OEE) System
Statistical Process Control (SPC) System
End to End Data Analysis and Real time Alerts
Optimizing Microcontroller Production
Integrating External Data
Real-time Anomaly Detection and Alert System
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