Semiconductor Equipment Efficiency Monitoring Software

Synopsis:

Equipment utilization and efficiency monitoring.  Monitoring of Equipment Uptime, Idle Time, In Error State. Integration with MES platform. Data used for correlation with Test Data.

Description:

Factory floor management involves a long list of tasks ranging from planning which lots get tested when and where on the test floor to managing the maintenance of ATE, probers, handlers, and product probe cards/load boards. Both test equipment engineers and test floor operation managers use the OEE Management module to assist in their daily tasks.  In addition, it supports them in tasks that have longer time horizons (weeks and months) and it facilitates commonality analysis by providing reports that associate test results with associated test cell equipment.

Customers benefit from monitoring for equipment uptime, idle time, in error state, and average number of lots/units tested.  Planners can use these metrics to assess the incoming test lots and the respective test cells needed to support these lots. Thereby, they can know if customer commitments can be meet for the contractual agreements. Test floor managers can look for ATEs performing poorly with respect to that particular fleet of ATEs and thereby ascertain unexpected maintenance needs.  If a particular probe card is repeatedly sent to be reworked it may be time to scrap it and order a new probe card.  Having this level of detail can assist in boosting factory utilization by as much as 0.5% which directly increases profitability.

Dependencies on other modules:

  • Raw Data monitoring
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