Transforming Automotive Semiconductor Yield Management with yieldWerx
Boost auto semiconductor manufacturing with our defect management and yield analysis tool.
Get Superior Yield Quality with Advanced Analytics
Our Automotive Specific Functionality module enhances semiconductor yield from fabrication to testing with statistical methods and defect tools, reducing loss and improving quality and reliability.
Key Features of Our Semiconductor Yield Management Software for Automotive Companies
Implement Outlier Detection:
Utilize diverse techniques for accurate pass/fail decisions from wafer to die levels.
Adapt Testing Applications:
Apply real-time and post-test procedures to meet stringent quality and reliability standards.
Deploy Advanced Algorithms:
Access a wide array of algorithms, such as SPAT, DPAT, GDBN, for thorough outlier assessment.
Monitor Parametric Shifts:
Track and adjust to process shifts, maintaining test limit relevance and accuracy.
Precision Testing, Scenario Modeling, and Data-Driven Analysis in Yield Management
Refine Testing with DPAT:
Customize testing limits at various stages of production and fine-tune them after testing to achieve unparalleled precision and control.
Simulate Testing Scenarios:
Simulate the effects of adjusting limits or applying new techniques for proactive decision-making, all without needing custom scripting.
Analyze with Precision:
Employ product test data for comprehensive exploration and strategic selection of the most effective detection algorithms.
Customized Integration for Automotive Yield Management
Ensure Industry Compliance:
Ensure compliance with Automotive Electronic Council standards by aligning operations with the Q001 Rev-D guidelines for excellence.
Integrate Yield Management Modules:
Integrate Reporting & Analysis with Yield Calculation Flexibility to adopt a cohesive approach, enhancing overall process synergy
Craft Custom Solutions:
Provide end-to-end personalized yield management solutions catering specifically to the manufacturing needs of the automotive industry.
Transforming Automotive Semiconductor Yield Management with yieldWerx
Boost auto semiconductor manufacturing with our defect management and yield analysis tool.
Get Superior Yield Quality with Advanced Analytics
Our Automotive Specific Functionality module enhances semiconductor yield from fabrication to testing with statistical methods and defect tools, reducing loss and improving quality and reliability.
Key Features of Our Semiconductor Yield Management Software for Automotive Companies
Implement Outlier Detection:
Utilize diverse techniques for accurate pass/fail decisions from wafer to die levels.
Adapt Testing Applications:
Apply real-time and post-test procedures to meet stringent quality and reliability standards.
Deploy Advanced Algorithms:
Access a wide array of algorithms, such as SPAT, DPAT, GDBN, for thorough outlier assessment.
Monitor Parametric Shifts:
Track and adjust to process shifts, maintaining test limit relevance and accuracy.
Precision Testing, Scenario Modeling, and Data-Driven Analysis in Yield Management
Refine Testing with DPAT:
Customize testing limits at various stages of production and fine-tune them after testing to achieve unparalleled precision and control.
Simulate Testing Scenarios:
SSimulate the effects of adjusting limits or applying new techniques for proactive decision-making, all without needing custom scripting.
Analyze with Precision:
Employ product test data for comprehensive exploration and strategic selection of the most effective detection algorithms.
Customized Integration for Automotive Yield Management
Ensure Industry Compliance:
Ensure compliance with Automotive Electronic Council standards by aligning operations with the Q001 Rev-D guidelines for excellence.
Integrate Yield Management Modules:
Integrate Reporting & Analysis with Yield Calculation Flexibility to adopt a cohesive approach, enhancing overall process synergy
Craft Custom Solutions:
Provide end-to-end personalized yield management solutions catering specifically to the manufacturing needs of the automotive industry.
Why Choose yieldWerx
Self Service Capability for Report Creation
Experience flexibility and control in crafting reports to suit your unique semiconductor needs.
100+ Management/SCM/Planning Widgets
Access widgets to update your management, supply chain, and planning activities, improving productivity.
Engineering & Quality Control Widgets
Use specialized widgets for engineering and design, ensuring top-notch product development and quality control.
Scalable Data Solutions
Explore cloud-hosted solutions in partnership with renowned providers like Amazon Web Services and Microsoft Azure.
PAT, GDBN Outlier Detection Moving Beyond Automotive
yieldWerx spearheads advanced PAT and GDBN techniques in outlier detection, elevating semiconductor testing to precision quality control
Part Average Test (PAT)
yieldWerx revolutionizes chip manufacturing with zero-defect PAT solutions, enhancing quality and reliability in high-stakes industries.
Driving Excellence in Automotive Semiconductor Yield Management.
Step into the future of semiconductor production with yieldWerx, the premier yield management solution designed for the automotive sector. Experience precision in defect management and yield analysis with our advanced statistical tools. They're crafted to refine your manufacturing, cut costs, and uphold exceptional quality.