Semiconductor Test Program Custom Limits

Synopsis:

Ability to create custom sets of limits or import them and then manage them in yieldWerx. Then allow users to use custom limits to perform analysis instead of having to enter in custom limits manually

Description:

Test manufacturing processes constantly evolve be it in response to return material analysis or modifying a test program in response to a design update.  In these situations, engineers need the ability to create and evaluate limits before they are hardcoded as rules or limits in a test program. The Custom Limits Manager provides this capability.

Also, at times engineers need to analyze raw data from a test or inspection step in which there are no accompanying pass/fail or defectivity limits.  This module facilitates applying limits. Raw data may or may not come with limits set and for engineers to analyze the data the ability to apply a limit or override an existing limit is provided by this module. With this module, engineers can simulate the impact of a new statistical bin limit or the impact of changing a pass/fail limit in a test program.  With the ability to save the limits, they can perform the analysis on multiple data sets; reload the limits previously used as opposed to entering them manually for each of the 75 lots that they want to analyze.  These discussed examples represent the many ways this module can be used by engineers and analysts to comprehend the impact of changes as well as to figure out how best to use a new data source for the manufacturing objective.

Engineering Roles Impacted:

 

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