Synopsis:
This module issues alerts to place lots on hold for lot disposition or direct lots to specific test programs. Alerts are based upon user-defined rules. Lot Commonality report capability is also provided.
Description:
Identification of wafer or assembly lots that could be potentially bad remains a daily activity in any test manufacturing facility. The Real-Time Lot Control & Disposition module connects statistical control limits (bin limits, yield limits) with a facility’s MES automation software. Once alerted the engineer/operator assesses the available lot data to make one of the following decisions: scrap, retest, downgrade, release the lot for the next manufacturing step.
This module requires the user to document their reasoning behind their decision; this enables feedback in your facility’s operations.
Also, the user can execute a Lot Commonality report to identify other lots/wafers that may have similar manufacturing history. The report can inform if these lots/wafers have also been flagged for lot disposition.
The user will also be able to tag lots as Good, Bad, and Ugly with usages as follows:
- Good Lots -- to be used in correlation and commonality analysis.
- Bad lots – to be excluded (optionally) from calculating any historical trend and limits calculations.
- Ugly lots—to be excluded from any type of automated reports and analysis.
The reports supported by this module will flag which lots/wafers fall into which category on the outputs and the user can also filter them out on initial data selection.
Where applied:
Wafer and Final Test